A Model to Evaluate Reliability of Authentication Protocols in C-ITS Safety-Critical Applications. Baee, M. A. R., Simpson, L., Boyen, X., Foo, E., & Pieprzyk, J. IEEE Trans. Veh. Technol., 70(9):9306–9319, 2021.
A Model to Evaluate Reliability of Authentication Protocols in C-ITS Safety-Critical Applications [link]Paper  doi  bibtex   1 download  
@article{DBLP:journals/tvt/BaeeSBFP21,
  author       = {Mir Ali Rezazadeh Baee and
                  Leonie Simpson and
                  Xavier Boyen and
                  Ernest Foo and
                  Josef Pieprzyk},
  title        = {A Model to Evaluate Reliability of Authentication Protocols in {C-ITS}
                  Safety-Critical Applications},
  journal      = {{IEEE} Trans. Veh. Technol.},
  volume       = {70},
  number       = {9},
  pages        = {9306--9319},
  year         = {2021},
  url          = {https://doi.org/10.1109/TVT.2021.3097088},
  doi          = {10.1109/TVT.2021.3097088},
  timestamp    = {Tue, 05 Oct 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/tvt/BaeeSBFP21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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