@inproceedings{conf/mtdt/Bahl04,
  added-at = {2005-01-28T00:00:00.000+0100},
  author = {Bahl, Swapnil},
  biburl = {https://www.bibsonomy.org/bibtex/2b31f70722acf33d9bbae450c6ff1d053/dblp},
  booktitle = {MTDT},
  crossref = {conf/mtdt/2004},
  ee = {http://doi.ieeecomputersociety.org/10.1109/MTDT.2004.2},
  interhash = {908e9b9ac9a8c097ba82883cd8099a88},
  intrahash = {b31f70722acf33d9bbae450c6ff1d053},
  isbn = {0-7695-2193-2},
  keywords = {dblp},
  pages = {78-83},
  publisher = {IEEE Computer Society},
  timestamp = {2019-10-17T20:45:01.000+0200},
  title = {A Novel Method for Silicon Configurable Test Flow and Algorithms for Testing, Debugging and Characterizing Different Types of Embedded Memories through a Shared Controller.},
  url = {http://dblp.uni-trier.de/db/conf/mtdt/mtdt2004.html#Bahl04},
  year = 2004
}

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