@inproceedings{conf/irps/BahlB19,
  added-at = {2019-05-31T00:00:00.000+0200},
  author = {Bahl, Sandeep R. and Brohlin, Paul},
  biburl = {https://www.bibsonomy.org/bibtex/2c8f0d6c72584a9ea543b171c10eaeb8d/dblp},
  booktitle = {IRPS},
  crossref = {conf/irps/2019},
  ee = {https://doi.org/10.1109/IRPS.2019.8720479},
  interhash = {c72608cc1e6d2aa6aa8f9546079b9655},
  intrahash = {c8f0d6c72584a9ea543b171c10eaeb8d},
  isbn = {978-1-5386-9504-3},
  keywords = {dblp},
  pages = {1-4},
  publisher = {IEEE},
  timestamp = {2019-10-17T14:45:22.000+0200},
  title = {A New Approach to Validate GaN FET Reliability to Power-Line Surges Under Use-Conditions.},
  url = {http://dblp.uni-trier.de/db/conf/irps/irps2019.html#BahlB19},
  year = 2019
}

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