Efficient Soft Error Vulnerability Analysis Using Non-intrusive Fault Injection Techniques. Bandeira, V., Rosa, F., Reis, R., & Ost, L. In IFIP/IEEE International Conference on Very Large Scale Integration-System on a Chip, pages 115–137. Springer. bibtex @InProceedings{bandeira19efficient,
author = {Bandeira, Vitor and Rosa, Felipe and Reis, Ricardo and Ost, Luciano},
booktitle = {IFIP/IEEE International Conference on Very Large Scale Integration-System on a Chip},
date = {2019},
title = {Efficient Soft Error Vulnerability Analysis Using Non-intrusive Fault Injection Techniques},
organization = {Springer},
pages = {115--137},
comment = {* motivation: soft-errors in critical systems
* fault model: single bit flips during execution of software
* in registers or memory
* due to, e.g., radiation
* experiments in simulator
M*DEV simulator (commercial)
* classify soft-errors
* fault injection points
* in register
* does not consider criticality of memory region
* in physical memory
* novel: in virtual memory
* framework maps automatically maps from virtual to physical memory
* aware of different segments
* e.g., data, code, read-only, debu
* novel: in application variables and data structures
* novel: in Function Object Cod
* novel: function lifespan
* limits injection to time where a function is active
* case study: inject in (NASA )benchmarks
* e.g., FFT solvers, sort
* results per benchmark and injection technique
* in MIPS
* in classified failures
* implement TMR for a benchmark, re-evaluate},
file = {:bandeira19efficient - Efficient Soft Error Vulnerability Analysis Using Non-intrusive Fault Injection Techniques.pdf:PDF},
groups = {fault injection},
timestamp = {2020-08-05},
}
Downloads: 0
{"_id":"3mDDxpZuSYxdjtP79","bibbaseid":"bandeira-rosa-reis-ost-efficientsofterrorvulnerabilityanalysisusingnonintrusivefaultinjectiontechniques","author_short":["Bandeira, V.","Rosa, F.","Reis, R.","Ost, L."],"bibdata":{"bibtype":"inproceedings","type":"inproceedings","author":[{"propositions":[],"lastnames":["Bandeira"],"firstnames":["Vitor"],"suffixes":[]},{"propositions":[],"lastnames":["Rosa"],"firstnames":["Felipe"],"suffixes":[]},{"propositions":[],"lastnames":["Reis"],"firstnames":["Ricardo"],"suffixes":[]},{"propositions":[],"lastnames":["Ost"],"firstnames":["Luciano"],"suffixes":[]}],"booktitle":"IFIP/IEEE International Conference on Very Large Scale Integration-System on a Chip","date":"2019","title":"Efficient Soft Error Vulnerability Analysis Using Non-intrusive Fault Injection Techniques","organization":"Springer","pages":"115–137","comment":"* motivation: soft-errors in critical systems * fault model: single bit flips during execution of software * in registers or memory * due to, e.g., radiation * experiments in simulator M*DEV simulator (commercial) * classify soft-errors * fault injection points * in register * does not consider criticality of memory region * in physical memory * novel: in virtual memory * framework maps automatically maps from virtual to physical memory * aware of different segments * e.g., data, code, read-only, debu * novel: in application variables and data structures * novel: in Function Object Cod * novel: function lifespan * limits injection to time where a function is active * case study: inject in (NASA )benchmarks * e.g., FFT solvers, sort * results per benchmark and injection technique * in MIPS * in classified failures * implement TMR for a benchmark, re-evaluate","file":":bandeira19efficient - Efficient Soft Error Vulnerability Analysis Using Non-intrusive Fault Injection Techniques.pdf:PDF","groups":"fault injection","timestamp":"2020-08-05","bibtex":"@InProceedings{bandeira19efficient,\n author = {Bandeira, Vitor and Rosa, Felipe and Reis, Ricardo and Ost, Luciano},\n booktitle = {IFIP/IEEE International Conference on Very Large Scale Integration-System on a Chip},\n date = {2019},\n title = {Efficient Soft Error Vulnerability Analysis Using Non-intrusive Fault Injection Techniques},\n organization = {Springer},\n pages = {115--137},\n comment = {* motivation: soft-errors in critical systems\n* fault model: single bit flips during execution of software\n\n * in registers or memory\n * due to, e.g., radiation\n\n* experiments in simulator\n\n M*DEV simulator (commercial)\n\n* classify soft-errors\n* fault injection points\n\n * in register\n\n * does not consider criticality of memory region\n\n * in physical memory\n * novel: in virtual memory\n\n * framework maps automatically maps from virtual to physical memory\n\n * aware of different segments\n\n * e.g., data, code, read-only, debu\n\n * novel: in application variables and data structures\n * novel: in Function Object Cod\n * novel: function lifespan\n\n * limits injection to time where a function is active\n\n* case study: inject in (NASA )benchmarks\n\n * e.g., FFT solvers, sort\n * results per benchmark and injection technique\n\n * in MIPS\n * in classified failures\n\n * implement TMR for a benchmark, re-evaluate},\n file = {:bandeira19efficient - Efficient Soft Error Vulnerability Analysis Using Non-intrusive Fault Injection Techniques.pdf:PDF},\n groups = {fault injection},\n timestamp = {2020-08-05},\n}\n\n","author_short":["Bandeira, V.","Rosa, F.","Reis, R.","Ost, L."],"key":"bandeira19efficient","id":"bandeira19efficient","bibbaseid":"bandeira-rosa-reis-ost-efficientsofterrorvulnerabilityanalysisusingnonintrusivefaultinjectiontechniques","role":"author","urls":{},"metadata":{"authorlinks":{}},"downloads":0,"html":""},"bibtype":"inproceedings","biburl":"https://bibbase.org/network/files/AsPiHTmHHGjgy6xSQ","dataSources":["wjZw5s4JL49uLwn3p"],"keywords":[],"search_terms":["efficient","soft","error","vulnerability","analysis","using","non","intrusive","fault","injection","techniques","bandeira","rosa","reis","ost"],"title":"Efficient Soft Error Vulnerability Analysis Using Non-intrusive Fault Injection Techniques","year":null}