@InProceedings{bandeira19efficient,
  author       = {Bandeira, Vitor and Rosa, Felipe and Reis, Ricardo and Ost, Luciano},
  booktitle    = {IFIP/IEEE International Conference on Very Large Scale Integration-System on a Chip},
  date         = {2019},
  title        = {Efficient Soft Error Vulnerability Analysis Using Non-intrusive Fault Injection Techniques},
  organization = {Springer},
  pages        = {115--137},
  comment      = {* motivation: soft-errors in critical systems
* fault model: single bit flips during execution of software

  * in registers or memory
  * due to, e.g., radiation

* experiments in simulator

  M*DEV simulator (commercial)

* classify soft-errors
* fault injection points

  * in register

    * does not consider criticality of memory region

  * in physical memory
  * novel: in virtual memory

    * framework maps automatically maps from virtual to physical memory

      * aware of different segments

        * e.g., data, code, read-only, debu

  * novel: in application variables and data structures
  * novel: in Function Object Cod
  * novel: function lifespan

    * limits injection to time where a function is active

* case study: inject in (NASA )benchmarks

  * e.g., FFT solvers, sort
  * results per benchmark and injection technique

    * in MIPS
    * in classified failures

  * implement TMR for a benchmark, re-evaluate},
  file         = {:bandeira19efficient - Efficient Soft Error Vulnerability Analysis Using Non-intrusive Fault Injection Techniques.pdf:PDF},
  groups       = {fault injection},
  timestamp    = {2020-08-05},
}

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