Safe sequential path planning under disturbances and imperfect information. Bansal, S., Chen, M., Fisac, J. F., & Tomlin, C. J. In ACC, pages 5550-5555, 2017. IEEE.
Safe sequential path planning under disturbances and imperfect information. [link]Link  Safe sequential path planning under disturbances and imperfect information. [link]Paper  bibtex   
@inproceedings{conf/amcc/BansalCFT17,
  added-at = {2025-08-08T00:00:00.000+0200},
  author = {Bansal, Somil and Chen, Mo and Fisac, Jaime F. and Tomlin, Claire J.},
  biburl = {https://www.bibsonomy.org/bibtex/29bc4390495e5bb17a68a99d3532990e6/dblp},
  booktitle = {ACC},
  crossref = {conf/amcc/2017},
  ee = {https://doi.org/10.23919/ACC.2017.7963818},
  interhash = {e86aeccc3ec53024c122736d5689a8c1},
  intrahash = {9bc4390495e5bb17a68a99d3532990e6},
  isbn = {978-1-5090-5992-8},
  keywords = {dblp},
  pages = {5550-5555},
  publisher = {IEEE},
  timestamp = {2025-08-11T08:44:31.000+0200},
  title = {Safe sequential path planning under disturbances and imperfect information.},
  url = {http://dblp.uni-trier.de/db/conf/amcc/acc2017.html#BansalCFT17},
  year = 2017
}

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