@article{DBLP:journals/tetc/BarenghiHBSRK14,
  author    = {Alessandro Barenghi and
               C{\'{e}}dric Hocquet and
               David Bol and
               Fran{\c{c}}ois{-}Xavier Standaert and
               Francesco Regazzoni and
               Israel Koren},
  title     = {A Combined Design-Time/Test-Time Study of the Vulnerability of Sub-Threshold
               Devices to Low Voltage Fault Attacks},
  journal   = {{IEEE} Trans. Emerg. Top. Comput.},
  volume    = {2},
  number    = {2},
  pages     = {107--118},
  year      = {2014},
  url       = {https://doi.org/10.1109/TETC.2014.2316509},
  doi       = {10.1109/TETC.2014.2316509},
  timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/journals/tetc/BarenghiHBSRK14.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}

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