Exploring the Feasibility of Low Cost Fault Injection Attacks on Sub-threshold Devices through an Example of a 65nm AES Implementation. Barenghi, A., Hocquet, C., Bol, D., Standaert, F., Regazzoni, F., & Koren, I. In Juels, A. & Paar, C., editors, RFID. Security and Privacy - 7th International Workshop, RFIDSec 2011, Amherst, USA, June 26-28, 2011, Revised Selected Papers, volume 7055, of Lecture Notes in Computer Science, pages 48–60, 2011. Springer.
Exploring the Feasibility of Low Cost Fault Injection Attacks on Sub-threshold Devices through an Example of a 65nm AES Implementation [link]Paper  doi  bibtex   
@inproceedings{DBLP:conf/rfidsec/BarenghiHBSRK11,
  author    = {Alessandro Barenghi and
               C{\'{e}}dric Hocquet and
               David Bol and
               Fran{\c{c}}ois{-}Xavier Standaert and
               Francesco Regazzoni and
               Israel Koren},
  editor    = {Ari Juels and
               Christof Paar},
  title     = {Exploring the Feasibility of Low Cost Fault Injection Attacks on Sub-threshold
               Devices through an Example of a 65nm {AES} Implementation},
  booktitle = {{RFID.} Security and Privacy - 7th International Workshop, RFIDSec
               2011, Amherst, USA, June 26-28, 2011, Revised Selected Papers},
  series    = {Lecture Notes in Computer Science},
  volume    = {7055},
  pages     = {48--60},
  publisher = {Springer},
  year      = {2011},
  url       = {https://doi.org/10.1007/978-3-642-25286-0\_4},
  doi       = {10.1007/978-3-642-25286-0\_4},
  timestamp = {Tue, 31 Mar 2020 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/conf/rfidsec/BarenghiHBSRK11.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}

Downloads: 0