Exploring the Feasibility of Low Cost Fault Injection Attacks on Sub-threshold Devices through an Example of a 65nm AES Implementation. Barenghi, A., Hocquet, C., Bol, D., Standaert, F., Regazzoni, F., & Koren, I. In Juels, A. & Paar, C., editors, RFID. Security and Privacy - 7th International Workshop, RFIDSec 2011, Amherst, USA, June 26-28, 2011, Revised Selected Papers, volume 7055, of Lecture Notes in Computer Science, pages 48–60, 2011. Springer. Paper doi bibtex @inproceedings{DBLP:conf/rfidsec/BarenghiHBSRK11,
author = {Alessandro Barenghi and
C{\'{e}}dric Hocquet and
David Bol and
Fran{\c{c}}ois{-}Xavier Standaert and
Francesco Regazzoni and
Israel Koren},
editor = {Ari Juels and
Christof Paar},
title = {Exploring the Feasibility of Low Cost Fault Injection Attacks on Sub-threshold
Devices through an Example of a 65nm {AES} Implementation},
booktitle = {{RFID.} Security and Privacy - 7th International Workshop, RFIDSec
2011, Amherst, USA, June 26-28, 2011, Revised Selected Papers},
series = {Lecture Notes in Computer Science},
volume = {7055},
pages = {48--60},
publisher = {Springer},
year = {2011},
url = {https://doi.org/10.1007/978-3-642-25286-0\_4},
doi = {10.1007/978-3-642-25286-0\_4},
timestamp = {Tue, 31 Mar 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/rfidsec/BarenghiHBSRK11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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