Geometry Characterization of Electro-adhesion Samples for Spacecraft Docking Application. Barnhart, D. & Ritter, M. In IEEE Aerospace Conference, March, 2017.
doi  bibtex   
@inproceedings{barnhart2017geometry,
  title={Geometry Characterization of Electro-adhesion Samples for Spacecraft Docking Application},
  author={Barnhart, David and Ritter, Mikela},
  booktitle={IEEE Aerospace Conference},
  year={2017},
  month = mar,
  doi={10.1109/AERO.2017.7943683}
}

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