Geometry Characterization of Electro-adhesion Samples for Spacecraft Docking Application. Barnhart, D. & Ritter, M. In IEEE Aerospace Conference, March, 2017. doi bibtex @inproceedings{barnhart2017geometry,
title={Geometry Characterization of Electro-adhesion Samples for Spacecraft Docking Application},
author={Barnhart, David and Ritter, Mikela},
booktitle={IEEE Aerospace Conference},
year={2017},
month = mar,
doi={10.1109/AERO.2017.7943683}
}
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