A Thermodynamic Model for Electrical Current Induced Damage. Basaran, C., Lin, M., & Ye, H. In Proceedings of the 54th Electronic Components and Technology Conference (Cat. No.04CH37546), 2004. IEEE.
doi  bibtex   
@InProceedings{   Basaran_2004aa,
  author        = {Basaran, C. and Lin, Minghui and Ye, Hua},
  booktitle     = {Proceedings of the 54th Electronic Components and Technology Conference (Cat. No.04CH37546)},
  citable       = {1},
  doi           = {10.1109/ectc.2004.1320353},
  file          = {Basaran_2004aa.pdf},
  group         = {casper},
  internal      = {0},
  keywords      = {electrothermal,electronics,transistors,electromigration,modeling},
  langid        = {english},
  publisher     = {{IEEE}},
  title         = {A Thermodynamic Model for Electrical Current Induced Damage},
  year          = {2004}
}

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