A Thermodynamic Model for Electrical Current Induced Damage. Basaran, C., Lin, M., & Ye, H. In Proceedings of the 54th Electronic Components and Technology Conference (Cat. No.04CH37546), 2004. IEEE. doi bibtex @InProceedings{ Basaran_2004aa,
author = {Basaran, C. and Lin, Minghui and Ye, Hua},
booktitle = {Proceedings of the 54th Electronic Components and Technology Conference (Cat. No.04CH37546)},
citable = {1},
doi = {10.1109/ectc.2004.1320353},
file = {Basaran_2004aa.pdf},
group = {casper},
internal = {0},
keywords = {electrothermal,electronics,transistors,electromigration,modeling},
langid = {english},
publisher = {{IEEE}},
title = {A Thermodynamic Model for Electrical Current Induced Damage},
year = {2004}
}
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