Guest Editorial. Basu, K., Chen, M., & Parekhji, R. A. J. Electron. Test., 35(5):579–580, 2019. Paper doi bibtex @article{DBLP:journals/et/BasuCP19,
author = {Kanad Basu and
Mingsong Chen and
Rubin A. Parekhji},
title = {Guest Editorial},
journal = {J. Electron. Test.},
volume = {35},
number = {5},
pages = {579--580},
year = {2019},
url = {https://doi.org/10.1007/s10836-019-05836-6},
doi = {10.1007/s10836-019-05836-6},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/BasuCP19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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