Guest Editorial. Basu, K., Chen, M., & Parekhji, R. A. J. Electron. Test., 35(5):579–580, 2019.
Guest Editorial [link]Paper  doi  bibtex   
@article{DBLP:journals/et/BasuCP19,
  author    = {Kanad Basu and
               Mingsong Chen and
               Rubin A. Parekhji},
  title     = {Guest Editorial},
  journal   = {J. Electron. Test.},
  volume    = {35},
  number    = {5},
  pages     = {579--580},
  year      = {2019},
  url       = {https://doi.org/10.1007/s10836-019-05836-6},
  doi       = {10.1007/s10836-019-05836-6},
  timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/journals/et/BasuCP19.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}

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