Characterization of misfit dislocations in Si quantum well structures enabled by STEM based aberration correction. Batson, P. E & Lagos, M. J Ultramicroscopy, 180:34–40, Elsevier, 2017.
bibtex   
@article{batson2017characterization,
  title={Characterization of misfit dislocations in Si quantum well structures enabled by STEM based aberration correction},
  author={Batson, Philip E and Lagos, Maureen J},
  journal={Ultramicroscopy},
  volume={180},
  pages={34--40},
  year={2017},
  publisher={Elsevier}
}

Downloads: 0