@inproceedings{baudry_improving_2006,
	address = {Shanghai, China},
	title = {Improving {Test} {Suites} for {Efficient} {Fault} {Localization}},
	isbn = {1-59593-375-1},
	url = {http://doi.acm.org.proxy.wm.edu/10.1145/1134285.1134299},
	doi = {10.1145/1134285.1134299},
	booktitle = {Proceedings of the 28th {International} {Conference} on {Software} {Engineering}},
	publisher = {ACM},
	author = {Baudry, Benoit and Fleurey, Franck and Le Traon, Yves},
	year = {2006},
	keywords = {diagnosis, mutation analysis, test generation},
	pages = {82--91},
}

{"_id":"yhfb8dun6nkGbyJTF","bibbaseid":"baudry-fleurey-letraon-improvingtestsuitesforefficientfaultlocalization-2006","author_short":["Baudry, B.","Fleurey, F.","Le Traon, Y."],"bibdata":{"bibtype":"inproceedings","type":"inproceedings","address":"Shanghai, China","title":"Improving Test Suites for Efficient Fault Localization","isbn":"1-59593-375-1","url":"http://doi.acm.org.proxy.wm.edu/10.1145/1134285.1134299","doi":"10.1145/1134285.1134299","booktitle":"Proceedings of the 28th International Conference on Software Engineering","publisher":"ACM","author":[{"propositions":[],"lastnames":["Baudry"],"firstnames":["Benoit"],"suffixes":[]},{"propositions":[],"lastnames":["Fleurey"],"firstnames":["Franck"],"suffixes":[]},{"propositions":[],"lastnames":["Le","Traon"],"firstnames":["Yves"],"suffixes":[]}],"year":"2006","keywords":"diagnosis, mutation analysis, test generation","pages":"82–91","bibtex":"@inproceedings{baudry_improving_2006,\n\taddress = {Shanghai, China},\n\ttitle = {Improving {Test} {Suites} for {Efficient} {Fault} {Localization}},\n\tisbn = {1-59593-375-1},\n\turl = {http://doi.acm.org.proxy.wm.edu/10.1145/1134285.1134299},\n\tdoi = {10.1145/1134285.1134299},\n\tbooktitle = {Proceedings of the 28th {International} {Conference} on {Software} {Engineering}},\n\tpublisher = {ACM},\n\tauthor = {Baudry, Benoit and Fleurey, Franck and Le Traon, Yves},\n\tyear = {2006},\n\tkeywords = {diagnosis, mutation analysis, test generation},\n\tpages = {82--91},\n}\n\n","author_short":["Baudry, B.","Fleurey, F.","Le Traon, Y."],"key":"baudry_improving_2006","id":"baudry_improving_2006","bibbaseid":"baudry-fleurey-letraon-improvingtestsuitesforefficientfaultlocalization-2006","role":"author","urls":{"Paper":"http://doi.acm.org.proxy.wm.edu/10.1145/1134285.1134299"},"keyword":["diagnosis","mutation analysis","test generation"],"metadata":{"authorlinks":{}},"html":""},"bibtype":"inproceedings","biburl":"https://bibbase.org/zotero/kpmoran","dataSources":["EJbQZ5DryKAnqjJXj"],"keywords":["diagnosis","mutation analysis","test generation"],"search_terms":["improving","test","suites","efficient","fault","localization","baudry","fleurey","le traon"],"title":"Improving Test Suites for Efficient Fault Localization","year":2006}