The photoelastic coefficient P 12 of H+ implanted GaAs as a function of defect density. Baydin, A., Krzyzanowska, H., Gatamov, R., Garnett, J., & Tolk, N. Scientific Reports, 7(1):15150, December, 2017. ZSCC: NoCitationData[s0]
Paper
Paper doi abstract bibtex The photoelastic phenomenon has been widely investigated as a fundamental elastooptical property of solids. This effect has been applied extensively to study stress distribution in lattice-mismatched semiconductor heterostructures. GaAs based optoelectronic devices (e.g. solar cells, modulators, detectors, and diodes) used in space probes are subject to damage arising from energetic proton (H+) irradiation. For that reason, the effect of proton irradiation on photoelastic coefficients of GaAs is of primary importance to space applied optoelectronics. However, there yet remains a lack of systematic studies of energetic proton induced changes in the photoelastic properties of bulk GaAs. In this work, the H+ energy and fluence chosen for GaAs implantation are similar to that of protons originating from the radiation belts and solar flares. We present the depth-dependent photoelastic coefficient P 12 profile in non-annealed H+ implanted GaAs obtained from the analysis of the time-domain Brillouin scattering spectra. The depth-dependent profiles are found to be broader than the defect distribution profiles predicted by Monte Carlo simulations. This fact indicates that the changes in photoelastic coefficient P 12 depend nonlinearly on the defect concentrations created by the hydrogen implantation. These studies provide insight into the spatial extent to which defects influence photoelastic properties of GaAs.
@article{BaydinEtAl2017SR,
title = {The photoelastic coefficient {P} 12 of {H}+ implanted {GaAs} as a function of defect density},
volume = {7},
copyright = {All rights reserved},
issn = {2045-2322},
url = {https://doi.org/10.1038/s41598-017-14903-x http://www.nature.com/articles/s41598-017-14903-x},
doi = {10.1038/s41598-017-14903-x},
abstract = {The photoelastic phenomenon has been widely investigated as a fundamental elastooptical property of solids. This effect has been applied extensively to study stress distribution in lattice-mismatched semiconductor heterostructures. GaAs based optoelectronic devices (e.g. solar cells, modulators, detectors, and diodes) used in space probes are subject to damage arising from energetic proton (H+) irradiation. For that reason, the effect of proton irradiation on photoelastic coefficients of GaAs is of primary importance to space applied optoelectronics. However, there yet remains a lack of systematic studies of energetic proton induced changes in the photoelastic properties of bulk GaAs. In this work, the H+ energy and fluence chosen for GaAs implantation are similar to that of protons originating from the radiation belts and solar flares. We present the depth-dependent photoelastic coefficient P 12 profile in non-annealed H+ implanted GaAs obtained from the analysis of the time-domain Brillouin scattering spectra. The depth-dependent profiles are found to be broader than the defect distribution profiles predicted by Monte Carlo simulations. This fact indicates that the changes in photoelastic coefficient P 12 depend nonlinearly on the defect concentrations created by the hydrogen implantation. These studies provide insight into the spatial extent to which defects influence photoelastic properties of GaAs.},
number = {1},
journal = {Scientific Reports},
author = {Baydin, Andrey and Krzyzanowska, Halina and Gatamov, Rustam and Garnett, Joy and Tolk, Norman},
month = dec,
year = {2017},
note = {ZSCC: NoCitationData[s0]},
pages = {15150},
url_paper={https://api.zotero.org/users/5832111/publications/items/VI5ZKTP3/file/view}
}
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