A novel feature descriptor based on microscopy image statistics. Bayramoglu, N., Kannala, J., Åkerfelt, M., Kaakinen, M., Eklund, L., Nees, M., & Heikkila, J. In 2015 IEEE International Conference on Image Processing (ICIP), pages 2695-2699, 2015. IEEE. bibtex @inProceedings{
title = {A novel feature descriptor based on microscopy image statistics},
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booktitle = {2015 IEEE International Conference on Image Processing (ICIP)}
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