Influence of yttrium doping on the structural, morphological and optical properties of nanostructured ZnO thin films grown by spray pyrolysis. Bazta, O., Urbieta, A., Piqueras, J., Fernández, P., Addou, M., Calvino, J., & Hungría, A. Ceramics International, 45(6):6842-6852, 2019. cited By 15![Influence of yttrium doping on the structural, morphological and optical properties of nanostructured ZnO thin films grown by spray pyrolysis [link]](https://bibbase.org/img/filetypes/link.svg "link")
Paper doi abstract bibtex This study reports on the deposition of highly transparent, n-type ZnO thin films on glass substrate at 450 °C using spray pyrolysis processing, with the simultaneous insertion of yttrium (Y) at different percentages (0, 2, 5, 7 at%) as a dopant. The effect of Y doping on the structure, morphology and optical properties of Y doped ZnO (ZnO:Y) was investigated for optoelectronic applications. The obtained thin films were characterized by means of X-ray diffraction, field-emission scanning electron microscopy (FESEM), UV–visible absorbance measurements, photoluminescence (PL) and cathodoluminescence (CL) spectroscopy. The as-prepared films exhibit well-defined hexagonal wurtzite structure grown along [002]. Field emission scanning electron microscope micrographs of the pure ZnO and ZnO:Y showed that the films acquired a dominance of hexagonal-like grains, the morphology was influenced by Y incorporation. All the films showed high transparency in the visible domain with an average transmittance of 83%. The band gap energy, E g , increased from 3.12 eV to 3.18 eV by increasing the Y doping concentration up to 5 at% and then decreased to 3.15 eV for 7 at% Y content. The PL and CL measurements reveal a strong ultraviolet (UV) emission, suggesting that the as-prepared ZnO:Y thin films can potentially be used in optoelectronic devices. © 2018 Elsevier Ltd and Techna Group S.r.l.
@ARTICLE{Bazta20196842,
author={Bazta, O. and Urbieta, A. and Piqueras, J. and Fernández, P. and Addou, M. and Calvino, J.J. and Hungría, A.B.},
title={Influence of yttrium doping on the structural, morphological and optical properties of nanostructured ZnO thin films grown by spray pyrolysis},
journal={Ceramics International},
year={2019},
volume={45},
number={6},
pages={6842-6852},
doi={10.1016/j.ceramint.2018.12.178},
note={cited By 15},
url={https://www.scopus.com/inward/record.uri?eid=2-s2.0-85059118795&doi=10.1016%2fj.ceramint.2018.12.178&partnerID=40&md5=92fe47cfdac308a6264c13528a0a3ed1},
abstract={This study reports on the deposition of highly transparent, n-type ZnO thin films on glass substrate at 450 °C using spray pyrolysis processing, with the simultaneous insertion of yttrium (Y) at different percentages (0, 2, 5, 7 at%) as a dopant. The effect of Y doping on the structure, morphology and optical properties of Y doped ZnO (ZnO:Y) was investigated for optoelectronic applications. The obtained thin films were characterized by means of X-ray diffraction, field-emission scanning electron microscopy (FESEM), UV–visible absorbance measurements, photoluminescence (PL) and cathodoluminescence (CL) spectroscopy. The as-prepared films exhibit well-defined hexagonal wurtzite structure grown along [002]. Field emission scanning electron microscope micrographs of the pure ZnO and ZnO:Y showed that the films acquired a dominance of hexagonal-like grains, the morphology was influenced by Y incorporation. All the films showed high transparency in the visible domain with an average transmittance of 83%. The band gap energy, E g , increased from 3.12 eV to 3.18 eV by increasing the Y doping concentration up to 5 at% and then decreased to 3.15 eV for 7 at% Y content. The PL and CL measurements reveal a strong ultraviolet (UV) emission, suggesting that the as-prepared ZnO:Y thin films can potentially be used in optoelectronic devices. © 2018 Elsevier Ltd and Techna Group S.r.l.},
keywords={Deposition; Electron emission; Energy gap; Field emission; Field emission microscopes; Film preparation; II-VI semiconductors; Metallic films; Optical properties; Optoelectronic devices; Scanning electron microscopy; Semiconductor doping; Spray pyrolysis; Substrates; Thin films; Yttrium; Zinc oxide; Zinc sulfide, Absorbance measurements; Cathodoluminescence spectroscopy; Field emission scanning electron microscopes; Field emission scanning electron microscopy; Hexagonal wurtzite structure; Optoelectronic applications; Pyrolysis processing; Y-doped, Optical films},
document_type={Article},
source={Scopus},
}
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{"_id":"4xPXY5z4xBwYfDiw6","bibbaseid":"bazta-urbieta-piqueras-fernndez-addou-calvino-hungra-influenceofyttriumdopingonthestructuralmorphologicalandopticalpropertiesofnanostructuredznothinfilmsgrownbyspraypyrolysis-2019","authorIDs":[],"author_short":["Bazta, O.","Urbieta, A.","Piqueras, J.","Fernández, P.","Addou, M.","Calvino, J.","Hungría, A."],"bibdata":{"bibtype":"article","type":"article","author":[{"propositions":[],"lastnames":["Bazta"],"firstnames":["O."],"suffixes":[]},{"propositions":[],"lastnames":["Urbieta"],"firstnames":["A."],"suffixes":[]},{"propositions":[],"lastnames":["Piqueras"],"firstnames":["J."],"suffixes":[]},{"propositions":[],"lastnames":["Fernández"],"firstnames":["P."],"suffixes":[]},{"propositions":[],"lastnames":["Addou"],"firstnames":["M."],"suffixes":[]},{"propositions":[],"lastnames":["Calvino"],"firstnames":["J.J."],"suffixes":[]},{"propositions":[],"lastnames":["Hungría"],"firstnames":["A.B."],"suffixes":[]}],"title":"Influence of yttrium doping on the structural, morphological and optical properties of nanostructured ZnO thin films grown by spray pyrolysis","journal":"Ceramics International","year":"2019","volume":"45","number":"6","pages":"6842-6852","doi":"10.1016/j.ceramint.2018.12.178","note":"cited By 15","url":"https://www.scopus.com/inward/record.uri?eid=2-s2.0-85059118795&doi=10.1016%2fj.ceramint.2018.12.178&partnerID=40&md5=92fe47cfdac308a6264c13528a0a3ed1","abstract":"This study reports on the deposition of highly transparent, n-type ZnO thin films on glass substrate at 450 °C using spray pyrolysis processing, with the simultaneous insertion of yttrium (Y) at different percentages (0, 2, 5, 7 at%) as a dopant. The effect of Y doping on the structure, morphology and optical properties of Y doped ZnO (ZnO:Y) was investigated for optoelectronic applications. The obtained thin films were characterized by means of X-ray diffraction, field-emission scanning electron microscopy (FESEM), UV–visible absorbance measurements, photoluminescence (PL) and cathodoluminescence (CL) spectroscopy. The as-prepared films exhibit well-defined hexagonal wurtzite structure grown along [002]. Field emission scanning electron microscope micrographs of the pure ZnO and ZnO:Y showed that the films acquired a dominance of hexagonal-like grains, the morphology was influenced by Y incorporation. All the films showed high transparency in the visible domain with an average transmittance of 83%. The band gap energy, E g , increased from 3.12 eV to 3.18 eV by increasing the Y doping concentration up to 5 at% and then decreased to 3.15 eV for 7 at% Y content. The PL and CL measurements reveal a strong ultraviolet (UV) emission, suggesting that the as-prepared ZnO:Y thin films can potentially be used in optoelectronic devices. © 2018 Elsevier Ltd and Techna Group S.r.l.","keywords":"Deposition; Electron emission; Energy gap; Field emission; Field emission microscopes; Film preparation; II-VI semiconductors; Metallic films; Optical properties; Optoelectronic devices; Scanning electron microscopy; Semiconductor doping; Spray pyrolysis; Substrates; Thin films; Yttrium; Zinc oxide; Zinc sulfide, Absorbance measurements; Cathodoluminescence spectroscopy; Field emission scanning electron microscopes; Field emission scanning electron microscopy; Hexagonal wurtzite structure; Optoelectronic applications; Pyrolysis processing; Y-doped, Optical films","document_type":"Article","source":"Scopus","bibtex":"@ARTICLE{Bazta20196842,\nauthor={Bazta, O. and Urbieta, A. and Piqueras, J. and Fernández, P. and Addou, M. and Calvino, J.J. and Hungría, A.B.},\ntitle={Influence of yttrium doping on the structural, morphological and optical properties of nanostructured ZnO thin films grown by spray pyrolysis},\njournal={Ceramics International},\nyear={2019},\nvolume={45},\nnumber={6},\npages={6842-6852},\ndoi={10.1016/j.ceramint.2018.12.178},\nnote={cited By 15},\nurl={https://www.scopus.com/inward/record.uri?eid=2-s2.0-85059118795&doi=10.1016%2fj.ceramint.2018.12.178&partnerID=40&md5=92fe47cfdac308a6264c13528a0a3ed1},\nabstract={This study reports on the deposition of highly transparent, n-type ZnO thin films on glass substrate at 450 °C using spray pyrolysis processing, with the simultaneous insertion of yttrium (Y) at different percentages (0, 2, 5, 7 at%) as a dopant. The effect of Y doping on the structure, morphology and optical properties of Y doped ZnO (ZnO:Y) was investigated for optoelectronic applications. The obtained thin films were characterized by means of X-ray diffraction, field-emission scanning electron microscopy (FESEM), UV–visible absorbance measurements, photoluminescence (PL) and cathodoluminescence (CL) spectroscopy. The as-prepared films exhibit well-defined hexagonal wurtzite structure grown along [002]. Field emission scanning electron microscope micrographs of the pure ZnO and ZnO:Y showed that the films acquired a dominance of hexagonal-like grains, the morphology was influenced by Y incorporation. All the films showed high transparency in the visible domain with an average transmittance of 83%. The band gap energy, E g , increased from 3.12 eV to 3.18 eV by increasing the Y doping concentration up to 5 at% and then decreased to 3.15 eV for 7 at% Y content. The PL and CL measurements reveal a strong ultraviolet (UV) emission, suggesting that the as-prepared ZnO:Y thin films can potentially be used in optoelectronic devices. © 2018 Elsevier Ltd and Techna Group S.r.l.},\nkeywords={Deposition; Electron emission; Energy gap; Field emission; Field emission microscopes; Film preparation; II-VI semiconductors; Metallic films; Optical properties; Optoelectronic devices; Scanning electron microscopy; Semiconductor doping; Spray pyrolysis; Substrates; Thin films; Yttrium; Zinc oxide; Zinc sulfide, Absorbance measurements; Cathodoluminescence spectroscopy; Field emission scanning electron microscopes; Field emission scanning electron microscopy; Hexagonal wurtzite structure; Optoelectronic applications; Pyrolysis processing; Y-doped, Optical films},\ndocument_type={Article},\nsource={Scopus},\n}\n\n","author_short":["Bazta, O.","Urbieta, A.","Piqueras, J.","Fernández, P.","Addou, M.","Calvino, J.","Hungría, A."],"key":"Bazta20196842","id":"Bazta20196842","bibbaseid":"bazta-urbieta-piqueras-fernndez-addou-calvino-hungra-influenceofyttriumdopingonthestructuralmorphologicalandopticalpropertiesofnanostructuredznothinfilmsgrownbyspraypyrolysis-2019","role":"author","urls":{"Paper":"https://www.scopus.com/inward/record.uri?eid=2-s2.0-85059118795&doi=10.1016%2fj.ceramint.2018.12.178&partnerID=40&md5=92fe47cfdac308a6264c13528a0a3ed1"},"keyword":["Deposition; Electron emission; Energy gap; Field emission; Field emission microscopes; Film preparation; II-VI semiconductors; Metallic films; Optical properties; Optoelectronic devices; Scanning electron microscopy; Semiconductor doping; Spray pyrolysis; Substrates; Thin films; Yttrium; Zinc oxide; Zinc sulfide","Absorbance measurements; Cathodoluminescence spectroscopy; Field emission scanning electron microscopes; Field emission scanning electron microscopy; Hexagonal wurtzite structure; Optoelectronic applications; Pyrolysis processing; Y-doped","Optical films"],"downloads":0,"html":"","metadata":{"authorlinks":{}}},"bibtype":"article","biburl":"http://www2.uca.es/dept/cmat_qinor/nanomat/people/Group_5_years.bib","creationDate":"2020-10-26T16:39:31.355Z","downloads":0,"keywords":["deposition; electron emission; energy gap; field emission; field emission microscopes; film preparation; ii-vi semiconductors; metallic films; optical properties; optoelectronic devices; scanning electron microscopy; semiconductor doping; spray pyrolysis; substrates; thin films; yttrium; zinc oxide; zinc sulfide","absorbance measurements; cathodoluminescence spectroscopy; field emission scanning electron microscopes; field emission scanning electron microscopy; hexagonal wurtzite structure; optoelectronic applications; pyrolysis processing; y-doped","optical films"],"search_terms":["influence","yttrium","doping","structural","morphological","optical","properties","nanostructured","zno","thin","films","grown","spray","pyrolysis","bazta","urbieta","piqueras","fernández","addou","calvino","hungría"],"title":"Influence of yttrium doping on the structural, morphological and optical properties of nanostructured ZnO thin films grown by spray pyrolysis","year":2019,"dataSources":["pLaxbtGnTnBzs2x8w"]}