@article{journals/mam/BegAIA15,
  added-at = {2015-11-19T00:00:00.000+0100},
  author = {Beg, Azam and Awwad, Falah and Ibrahim, Walid and Ahmed, Faheem},
  biburl = {http://www.bibsonomy.org/bibtex/2fc5005987be8c8aae2643228ffd495ba/dblp},
  ee = {http://dx.doi.org/10.1016/j.micpro.2015.09.008},
  interhash = {c24d8bc315f3fcddece78d6959d3a442},
  intrahash = {fc5005987be8c8aae2643228ffd495ba},
  journal = {Microprocessors and Microsystems - Embedded Hardware Design},
  keywords = {dblp},
  number = 8,
  pages = {674-685},
  timestamp = {2015-11-20T11:35:18.000+0100},
  title = {On the reliability estimation of nano-circuits using neural networks.},
  url = {http://dblp.uni-trier.de/db/journals/mam/mam39.html#BegAIA15},
  volume = 39,
  year = 2015
}

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