Combining Boolean Gates and Branching Programs in One Model can Lead to Faster Circuits. Ben-Asher, Y., Stein, E., & Vaidyanathan, R. In 2017 IEEE International Parallel and Distributed Processing Symposium Workshops, IPDPS Workshops 2017, Orlando / Buena Vista, FL, USA, May 29 - June 2, 2017, pages 184–191, 2017. IEEE Computer Society.
Combining Boolean Gates and Branching Programs in One Model can Lead to Faster Circuits [link]Paper  doi  bibtex   
@inproceedings{DBLP:conf/ipps/Ben-AsherSV17,
  author    = {Yosi Ben{-}Asher and
               Esti Stein and
               Ramachandran Vaidyanathan},
  title     = {Combining Boolean Gates and Branching Programs in One Model can Lead
               to Faster Circuits},
  booktitle = {2017 {IEEE} International Parallel and Distributed Processing Symposium
               Workshops, {IPDPS} Workshops 2017, Orlando / Buena Vista, FL, USA,
               May 29 - June 2, 2017},
  pages     = {184--191},
  publisher = {{IEEE} Computer Society},
  year      = {2017},
  url       = {https://doi.org/10.1109/IPDPSW.2017.39},
  doi       = {10.1109/IPDPSW.2017.39},
  timestamp = {Wed, 16 Oct 2019 14:14:51 +0200},
  biburl    = {https://dblp.org/rec/conf/ipps/Ben-AsherSV17.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}

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