@article{10.1088/1361-6641/aad7a3,
doi = {10.1088/1361-6641/aad7a3},
url = {http://dx.doi.org/10.1088/1361-6641/aad7a3},
year = 2018,
publisher = {{IOP} Publishing},
volume = {33},
pages = {105002},
author = {Georg Bendt and Kevin Kaiser and Alla Heckel and Felix Rieger and Dennis Oing and Axel Lorke and Nicolas Perez Rodriguez and Gabi Schierning and Christian Jooss and Stephan Schulz},
title = {Structural and thermoelectrical characterization of epitaxial Sb2Te3 high quality thin films grown by thermal evaporation},
journal = {Semiconductor Science and Technology}
}

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