@proceedings{DBLP:conf/esem/2017,
  editor    = {Ayse Bener and
               Burak Turhan and
               Stefan Biffl},
  title     = {2017 {ACM/IEEE} International Symposium on Empirical Software Engineering
               and Measurement, {ESEM} 2017, Toronto, ON, Canada, November 9-10,
               2017},
  publisher = {{IEEE} Computer Society},
  year      = {2017},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/8169617/proceeding},
  isbn      = {978-1-5090-4039-1},
  timestamp = {Wed, 16 Oct 2019 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/conf/esem/2017.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}

{"_id":"JQALW4FWouB73P5DF","bibbaseid":"bener-turhan-biffl-2017acmieeeinternationalsymposiumonempiricalsoftwareengineeringandmeasurementesem2017torontooncanadanovember9102017-2017","downloads":0,"creationDate":"2018-12-18T13:37:32.250Z","title":"2017 ACM/IEEE International Symposium on Empirical Software Engineering and Measurement, ESEM 2017, Toronto, ON, Canada, November 9-10, 2017","author_short":null,"year":2017,"bibtype":"proceedings","biburl":"https://dblp.org/pid/62/1974.bib","bibdata":{"bibtype":"proceedings","type":"proceedings","editor":[{"firstnames":["Ayse"],"propositions":[],"lastnames":["Bener"],"suffixes":[]},{"firstnames":["Burak"],"propositions":[],"lastnames":["Turhan"],"suffixes":[]},{"firstnames":["Stefan"],"propositions":[],"lastnames":["Biffl"],"suffixes":[]}],"title":"2017 ACM/IEEE International Symposium on Empirical Software Engineering and Measurement, ESEM 2017, Toronto, ON, Canada, November 9-10, 2017","publisher":"IEEE Computer Society","year":"2017","url":"https://ieeexplore.ieee.org/xpl/conhome/8169617/proceeding","isbn":"978-1-5090-4039-1","timestamp":"Wed, 16 Oct 2019 01:00:00 +0200","biburl":"https://dblp.org/rec/conf/esem/2017.bib","bibsource":"dblp computer science bibliography, https://dblp.org","bibtex":"@proceedings{DBLP:conf/esem/2017,\n editor = {Ayse Bener and\n Burak Turhan and\n Stefan Biffl},\n title = {2017 {ACM/IEEE} International Symposium on Empirical Software Engineering\n and Measurement, {ESEM} 2017, Toronto, ON, Canada, November 9-10,\n 2017},\n publisher = {{IEEE} Computer Society},\n year = {2017},\n url = {https://ieeexplore.ieee.org/xpl/conhome/8169617/proceeding},\n isbn = {978-1-5090-4039-1},\n timestamp = {Wed, 16 Oct 2019 01:00:00 +0200},\n biburl = {https://dblp.org/rec/conf/esem/2017.bib},\n bibsource = {dblp computer science bibliography, https://dblp.org}\n}\n\n","editor_short":["Bener, A.","Turhan, B.","Biffl, S."],"key":"DBLP:conf/esem/2017","id":"DBLP:conf/esem/2017","bibbaseid":"bener-turhan-biffl-2017acmieeeinternationalsymposiumonempiricalsoftwareengineeringandmeasurementesem2017torontooncanadanovember9102017-2017","role":"editor","urls":{"Paper":"https://ieeexplore.ieee.org/xpl/conhome/8169617/proceeding"},"metadata":{"authorlinks":{}}},"search_terms":["2017","acm","ieee","international","symposium","empirical","software","engineering","measurement","esem","2017","toronto","canada","november","2017"],"keywords":[],"authorIDs":[],"dataSources":["bp33h6ScZPqip9tCT","6rzwhSSkshugLZ5tE"]}