Comparing Exhaustive and Random Fault Injection Methods for Configuration Memory on SRAM-based FPGAs. Benevenuti, F. & Kastensmidt, F. L. In 2019 IEEE Latin American Test Symposium (LATS), pages 1–6, 2019. IEEE.
bibtex   
@InProceedings{benevenuti19comparing,
  author       = {Benevenuti, Fabio and Kastensmidt, Fernanda Lima},
  title        = {Comparing Exhaustive and Random Fault Injection Methods for Configuration Memory on SRAM-based FPGAs},
  booktitle    = {2019 IEEE Latin American Test Symposium (LATS)},
  year         = {2019},
  organization = {IEEE},
  pages        = {1--6},
  comment      = {* fault injection emulation in configuration memory bits of an SRAM-based FPGA
* find that random experiment execution is quicker in revealing problems than exhaustive

  * i.e., it is quicker for evaluating designs},
  groups       = {hardware},
  timestamp    = {2019-06-20},
}

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