Comparing Exhaustive and Random Fault Injection Methods for Configuration Memory on SRAM-based FPGAs. Benevenuti, F. & Kastensmidt, F. L. In 2019 IEEE Latin American Test Symposium (LATS), pages 1–6, 2019. IEEE. bibtex @InProceedings{benevenuti19comparing,
author = {Benevenuti, Fabio and Kastensmidt, Fernanda Lima},
title = {Comparing Exhaustive and Random Fault Injection Methods for Configuration Memory on SRAM-based FPGAs},
booktitle = {2019 IEEE Latin American Test Symposium (LATS)},
year = {2019},
organization = {IEEE},
pages = {1--6},
comment = {* fault injection emulation in configuration memory bits of an SRAM-based FPGA
* find that random experiment execution is quicker in revealing problems than exhaustive
* i.e., it is quicker for evaluating designs},
groups = {hardware},
timestamp = {2019-06-20},
}
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