A Two-Factor Error Model for Quantitative Steganalysis. Böhme, R. & Ker, A. In Delp, E. J. & Wong, P. W., editors, Proceedings of SPIE-IS&T Electronic Imaging: Security, Steganography and Watermarking of Multimedia Contents VIII, volume 6072, pages 59–74, San Jose, CA, 2006.
bibtex   
@inproceedings{BK2006-SPIE,
	Address = {San Jose, CA},
	Author = {B{\"o}hme, Rainer and Ker, Andrew},
	Booktitle = {Proceedings of SPIE-IS\&T Electronic Imaging: Security, Steganography and Watermarking of Multimedia Contents VIII},
	Date-Modified = {2015-04-09 21:59:52 +0000},
	Editor = {Delp, E. J. and Wong, P. W.},
	Pages = {59--74},
	Title = {A Two-Factor Error Model for Quantitative Steganalysis},
	Volume = {6072},
	Year = {2006}}

Downloads: 0