A Two-Factor Error Model for Quantitative Steganalysis. Böhme, R. & Ker, A. In Delp, E. J. & Wong, P. W., editors, Proceedings of SPIE-IS&T Electronic Imaging: Security, Steganography and Watermarking of Multimedia Contents VIII, volume 6072, pages 59–74, San Jose, CA, 2006. bibtex @inproceedings{BK2006-SPIE,
Address = {San Jose, CA},
Author = {B{\"o}hme, Rainer and Ker, Andrew},
Booktitle = {Proceedings of SPIE-IS\&T Electronic Imaging: Security, Steganography and Watermarking of Multimedia Contents VIII},
Date-Modified = {2015-04-09 21:59:52 +0000},
Editor = {Delp, E. J. and Wong, P. W.},
Pages = {59--74},
Title = {A Two-Factor Error Model for Quantitative Steganalysis},
Volume = {6072},
Year = {2006}}
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