Beyond mahalanobis metric: cayley-klein metric learning. Bi, Y., Fan, B., & Wu, F. In Proc. IEEE Conference on Computer Vision and Pattern Recognition, pages 2339--2347, Boston, MA, June 7 - 12, 2015. bibtex @Inproceedings{Bi_2015_16507,
author = {Bi, Yanhong and Fan, Bin and Wu, Fuchao},
address = {Boston, MA},
booktitle = {Proc. IEEE Conference on Computer Vision and Pattern Recognition},
month = {June 7 - 12},
pages = {2339--2347},
title = {Beyond mahalanobis metric: cayley-klein metric learning},
year = {2015},
snippets = {cvpr2015},
title_with_no_special_chars = {Beyond Mahalanobis Metric CayleyKlein Metric Learning}
}
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