Automated thresholded region classification using a robust feature selection method for PET-CT. Bi, L., Kim, J., Wen, L., Feng, D. D., & Fulham, M. J. In 12th IEEE International Symposium on Biomedical Imaging, ISBI 2015, Brooklyn, NY, USA, April 16-19, 2015, pages 1435–1438, 2015. IEEE.
Paper doi bibtex @inproceedings{DBLP:conf/isbi/BiKWFF15,
author = {Lei Bi and
Jinman Kim and
Lingfeng Wen and
David Dagan Feng and
Michael J. Fulham},
title = {Automated thresholded region classification using a robust feature
selection method for {PET-CT}},
booktitle = {12th {IEEE} International Symposium on Biomedical Imaging, {ISBI}
2015, Brooklyn, NY, USA, April 16-19, 2015},
pages = {1435--1438},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/ISBI.2015.7164146},
doi = {10.1109/ISBI.2015.7164146},
timestamp = {Thu, 02 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/isbi/BiKWFF15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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