@article{ ISI:000240602500069,
Author = {Bilzer, C. and Devolder, T. and Kim, Joo-Von and Counil, G. and
   Chappert, C. and Cardoso, S. and Freitas, P. P.},
Title = {{Study of the dynamic magnetic properties of soft CoFeB films}},
Journal = {{JOURNAL OF APPLIED PHYSICS}},
Year = {{2006}},
Volume = {{100}},
Number = {{5}},
Month = {{SEP 1}},
Abstract = {{We study the magnetization damping in ion-beam deposited Co72Fe18B10
   thin films as a function of film thickness and crystalline state.
   As-deposited amorphous layers showed low damping (alpha(app)=0.006) that
   is thickness independent. 40 nm Co80Fe20 with no boron content exhibited
   a value twice higher (alpha(app)=0.013). Crystallization in Co72Fe18B10,
   triggered by annealing at 280 degrees C, results in increased
   magnetization as well as a strong increase in damping, by a factor of 5
   for 40 nm films. For lower thicknesses the damping increase upon
   annealing is less pronounced. The exchange stiffness constant for
   amorphous films is deduced from perpendicular standing spin waves to be
   28.4x10(-12) J/m. The annealing dependence of damping should have
   consequences for the spin-transfer switching in CoFeB/MgO/CoFeB magnetic
   tunnel junctions. (c) 2006 American Institute of Physics.}},
DOI = {{10.1063/1.2337165}},
Article-Number = {{053903}},
ISSN = {{0021-8979}},
EISSN = {{1089-7550}},
ResearcherID-Numbers = {{de Freitas, Susana Cardoso/B-6199-2013
   Devolder, Thibaut/A-7027-2015
   Freitas, Paulo J.P./B-6164-2013
   Kim, Joo-Von/B-3672-2008}},
ORCID-Numbers = {{de Freitas, Susana Cardoso/0000-0001-6913-6529
   Devolder, Thibaut/0000-0001-7998-0993
   Freitas, Paulo J.P./0000-0003-0015-1186
   Kim, Joo-Von/0000-0002-3849-649X}},
Unique-ID = {{ISI:000240602500069}},
}

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