Failure Analysis of Virtual and Physical Machines: Patterns, Causes and Characteristics. Birke, R., Giurgiu, I., Chen, L. Y., Wiesmann, D., & Engbersen, T. In 44th Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2014, Atlanta, GA, USA, June 23-26, 2014, pages 1–12, 2014. IEEE Computer Society.
Failure Analysis of Virtual and Physical Machines: Patterns, Causes and Characteristics [link]Paper  doi  bibtex   
@inproceedings{DBLP:conf/dsn/BirkeGCWE14,
  author       = {Robert Birke and
                  Ioana Giurgiu and
                  Lydia Y. Chen and
                  Dorothea Wiesmann and
                  Ton Engbersen},
  title        = {Failure Analysis of Virtual and Physical Machines: Patterns, Causes
                  and Characteristics},
  booktitle    = {44th Annual {IEEE/IFIP} International Conference on Dependable Systems
                  and Networks, {DSN} 2014, Atlanta, GA, USA, June 23-26, 2014},
  pages        = {1--12},
  publisher    = {{IEEE} Computer Society},
  year         = {2014},
  url          = {https://doi.org/10.1109/DSN.2014.18},
  doi          = {10.1109/DSN.2014.18},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dsn/BirkeGCWE14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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