Failure Analysis of Virtual and Physical Machines: Patterns, Causes and Characteristics. Birke, R., Giurgiu, I., Chen, L. Y., Wiesmann, D., & Engbersen, T. In 44th Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2014, Atlanta, GA, USA, June 23-26, 2014, pages 1–12, 2014. IEEE Computer Society.
Paper doi bibtex @inproceedings{DBLP:conf/dsn/BirkeGCWE14,
author = {Robert Birke and
Ioana Giurgiu and
Lydia Y. Chen and
Dorothea Wiesmann and
Ton Engbersen},
title = {Failure Analysis of Virtual and Physical Machines: Patterns, Causes
and Characteristics},
booktitle = {44th Annual {IEEE/IFIP} International Conference on Dependable Systems
and Networks, {DSN} 2014, Atlanta, GA, USA, June 23-26, 2014},
pages = {1--12},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/DSN.2014.18},
doi = {10.1109/DSN.2014.18},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dsn/BirkeGCWE14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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