Electromigration - A brief survey and some recent results. Black, J. IEEE Transactions on Electron Devices, 16(4):338–347, Institute of Electrical & Electronics Engineers (IEEE), April, 1969.
doi  bibtex   
@Article{         Black_1969aa,
  author        = {Black, J.R.},
  citable       = {1},
  doi           = {10.1109/t-ed.1969.16754},
  file          = {Black_1969aa.pdf},
  group         = {casper},
  internal      = {0},
  issn          = {0018-9383},
  journal       = {IEEE Transactions on Electron Devices},
  keywords      = {aging},
  langid        = {english},
  month         = apr,
  number        = {4},
  pages         = {338–347},
  publisher     = {Institute of Electrical \& Electronics Engineers (IEEE)},
  title         = {Electromigration - A brief survey and some recent results},
  volume        = {16},
  year          = {1969},
  shortjournal  = {IEEE Trans. Electron. Dev.}
}

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