@inproceedings{ conf/ftcs/BlantonH93,
  added-at = {2015-08-17T00:00:00.000+0200},
  author = {Blanton, Ronald D. and Hayes, John P.},
  biburl = {http://www.bibsonomy.org/bibtex/2dda636704032445e1b07f77bda85823a/dblp},
  booktitle = {FTCS},
  crossref = {conf/ftcs/1993},
  ee = {http://dx.doi.org/10.1109/FTCS.1993.627321},
  interhash = {c4a1b0097d1a22184acf0c654df79dc4},
  intrahash = {dda636704032445e1b07f77bda85823a},
  isbn = {0-8186-3680-7},
  keywords = {dblp},
  pages = {176-185},
  publisher = {IEEE Computer Society},
  title = {Efficient Testing of Tree Circuits.},
  url = {http://dblp.uni-trier.de/db/conf/ftcs/ftcs93.html#BlantonH93},
  year = {1993}
}

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