@article{journals/dt/BlantonTYNP12,
  added-at = {2016-03-09T00:00:00.000+0100},
  author = {Blanton, R. D. (Shawn) and Tam, Wing Chiu and Yu, Xiaochun and Nelson, Jeffrey E. and Poku, Osei},
  biburl = {http://www.bibsonomy.org/bibtex/20301686b33293520a5b196682a5045be/dblp},
  ee = {http://doi.ieeecomputersociety.org/10.1109/MDT.2011.2178587},
  interhash = {cec8319089be70138d4fcace5c59c9a9},
  intrahash = {0301686b33293520a5b196682a5045be},
  journal = {IEEE Design & Test of Computers},
  keywords = {dblp},
  number = 1,
  pages = {36-47},
  timestamp = {2016-03-10T16:34:06.000+0100},
  title = {Yield Learning Through Physically Aware Diagnosis of IC-Failure Populations.},
  url = {http://dblp.uni-trier.de/db/journals/dt/dt29.html#BlantonTYNP12},
  volume = 29,
  year = 2012
}

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