@InProceedings{boespflug19predicting,
  author       = {Boespflug, Etienne and Gourier, Romain and Lanet, Jean-Louis},
  booktitle    = {2019 International Workshop on Big Data and Information Security (IWBIS)},
  date         = {2019},
  title        = {Predicting the Effect of Hardware Fault Injection},
  organization = {IEEE},
  pages        = {103--108},
  comment      = {* mutate source on instruction level
* to find vulnurabilities for electromagnetic fault injection
* so (hardware? PCB?) designers can test their designs},
  groups       = {fault removal},
  timestamp    = {2020-12-22},
}

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