Predicting the Effect of Hardware Fault Injection. Boespflug, E., Gourier, R., & Lanet, J. In 2019 International Workshop on Big Data and Information Security (IWBIS), pages 103–108. IEEE. bibtex @InProceedings{boespflug19predicting,
author = {Boespflug, Etienne and Gourier, Romain and Lanet, Jean-Louis},
booktitle = {2019 International Workshop on Big Data and Information Security (IWBIS)},
date = {2019},
title = {Predicting the Effect of Hardware Fault Injection},
organization = {IEEE},
pages = {103--108},
comment = {* mutate source on instruction level
* to find vulnurabilities for electromagnetic fault injection
* so (hardware? PCB?) designers can test their designs},
groups = {fault removal},
timestamp = {2020-12-22},
}
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