Achieving Effective Test Suites for Reactive Systems using Specification Mining and Test Suite Reduction Techniques. Bokil, P., Krishnan, P., & Venkatesh, R. ACM SIGSOFT Software Engineering Notes, 40(1):1-8, 2015.
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Paper bibtex @article{journals/sigsoft/BokilKV15,
added-at = {2015-02-07T00:00:00.000+0100},
author = {Bokil, Prasad and Krishnan, Padmanabhan and Venkatesh, R.},
biburl = {http://www.bibsonomy.org/bibtex/209607619c206cf097564f1f89d7ea335/dblp},
ee = {http://doi.acm.org/10.1145/2693208.2693226},
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intrahash = {09607619c206cf097564f1f89d7ea335},
journal = {ACM SIGSOFT Software Engineering Notes},
keywords = {dblp},
number = 1,
pages = {1-8},
timestamp = {2015-06-18T09:15:24.000+0200},
title = {Achieving Effective Test Suites for Reactive Systems using Specification Mining and Test Suite Reduction Techniques.},
url = {http://dblp.uni-trier.de/db/journals/sigsoft/sigsoft40.html#BokilKV15},
volume = 40,
year = 2015
}
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