Defect analysis in power mode control logic of low-power SRAMs. Bonet Zordan, L., Bosio, A., Dilillo, L., Girard, P., Todri, A., Virazel, A., & Badereddine, N. In Proceedings of European Test Symposium, pages 1, 2012.
Defect analysis in power mode control logic of low-power SRAMs [link]Paper  bibtex   
@inproceedings{ dblp2111520,
  title = {Defect analysis in power mode control logic of low-power SRAMs},
  author = {Leonardo Bonet Zordan and Alberto Bosio and Luigi Dilillo and Patrick Girard and Aida Todri and Arnaud Virazel and Nabil Badereddine},
  author_short = {Bonet Zordan, L. and Bosio, A. and Dilillo, L. and Girard, P. and Todri, A. and Virazel, A. and Badereddine, N.},
  bibtype = {inproceedings},
  type = {inproceedings},
  year = {2012},
  key = {dblp2111520},
  id = {dblp2111520},
  biburl = {http://www.dblp.org/rec/bibtex/conf/ets/ZordanBDGTVB12},
  url = {http://dx.doi.org/10.1109/ETS.2012.6233033},
  conference = {European Test Symposium},
  pages = {1},
  text = {European Test Symposium 2012:1},
  booktitle = {Proceedings of European Test Symposium}
}

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