Defect analysis in power mode control logic of low-power SRAMs. Bonet Zordan, L., Bosio, A., Dilillo, L., Girard, P., Todri, A., Virazel, A., & Badereddine, N. In Proceedings of European Test Symposium, pages 1, 2012.
Paper bibtex @inproceedings{ dblp2111520,
title = {Defect analysis in power mode control logic of low-power SRAMs},
author = {Leonardo Bonet Zordan and Alberto Bosio and Luigi Dilillo and Patrick Girard and Aida Todri and Arnaud Virazel and Nabil Badereddine},
author_short = {Bonet Zordan, L. and Bosio, A. and Dilillo, L. and Girard, P. and Todri, A. and Virazel, A. and Badereddine, N.},
bibtype = {inproceedings},
type = {inproceedings},
year = {2012},
key = {dblp2111520},
id = {dblp2111520},
biburl = {http://www.dblp.org/rec/bibtex/conf/ets/ZordanBDGTVB12},
url = {http://dx.doi.org/10.1109/ETS.2012.6233033},
conference = {European Test Symposium},
pages = {1},
text = {European Test Symposium 2012:1},
booktitle = {Proceedings of European Test Symposium}
}
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