@article{ dblp3610843,
  title = {Power-Driven Routing-Constrained Scan Chain Design},
  author = {Yannick Bonhomme and Patrick Girard and Loïs Guiller and Christian Landrault and Serge Pravossoudovitch},
  author_short = {Bonhomme, Y. and Girard, P. and Guiller, L. and Landrault, C. and Pravossoudovitch, S.},
  bibtype = {article},
  type = {article},
  year = {2004},
  key = {dblp3610843},
  id = {dblp3610843},
  biburl = {http://www.dblp.org/rec/bibtex/journals/et/BonhommeGGLP04},
  url = {http://dx.doi.org/10.1007/s10677-004-4252-2},
  journal = {J. Electronic Testing (ET)},
  pages = {647-660},
  number = {6},
  volume = {20},
  text = {J. Electronic Testing (ET) 20(6):647-660 (2004)}
}

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