Power-Driven Routing-Constrained Scan Chain Design. Bonhomme, Y., Girard, P., Guiller, L., Landrault, C., & Pravossoudovitch, S. J. Electronic Testing (ET), 20(6):647-660, 2004.
Paper bibtex @article{ dblp3610843,
title = {Power-Driven Routing-Constrained Scan Chain Design},
author = {Yannick Bonhomme and Patrick Girard and Loïs Guiller and Christian Landrault and Serge Pravossoudovitch},
author_short = {Bonhomme, Y. and Girard, P. and Guiller, L. and Landrault, C. and Pravossoudovitch, S.},
bibtype = {article},
type = {article},
year = {2004},
key = {dblp3610843},
id = {dblp3610843},
biburl = {http://www.dblp.org/rec/bibtex/journals/et/BonhommeGGLP04},
url = {http://dx.doi.org/10.1007/s10677-004-4252-2},
journal = {J. Electronic Testing (ET)},
pages = {647-660},
number = {6},
volume = {20},
text = {J. Electronic Testing (ET) 20(6):647-660 (2004)}
}
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{"_id":"EEWFAGRKiQvGEaig5","bibbaseid":"bonhomme-girard-guiller-landrault-pravossoudovitch-powerdrivenroutingconstrainedscanchaindesign-2004","downloads":0,"creationDate":"2015-04-07T17:36:59.974Z","title":"Power-Driven Routing-Constrained Scan Chain Design","author_short":["Bonhomme, Y.","Girard, P.","Guiller, L.","Landrault, C.","Pravossoudovitch, S."],"year":2004,"bibtype":"article","biburl":"http://www.dblp.org/rec/bibtex/journals/et/BonhommeGGLP04","bibdata":{"title":"Power-Driven Routing-Constrained Scan Chain Design","author":["Yannick Bonhomme","Patrick Girard","Loïs Guiller","Christian Landrault","Serge Pravossoudovitch"],"author_short":["Bonhomme, Y.","Girard, P.","Guiller, L.","Landrault, C.","Pravossoudovitch, S."],"bibtype":"article","type":"article","year":"2004","key":"dblp3610843","id":"dblp3610843","biburl":"http://www.dblp.org/rec/bibtex/journals/et/BonhommeGGLP04","url":"http://dx.doi.org/10.1007/s10677-004-4252-2","journal":"J. Electronic Testing (ET)","pages":"647-660","number":"6","volume":"20","text":"J. Electronic Testing (ET) 20(6):647-660 (2004)","bibtex":"@article{ dblp3610843,\n title = {Power-Driven Routing-Constrained Scan Chain Design},\n author = {Yannick Bonhomme and Patrick Girard and Loïs Guiller and Christian Landrault and Serge Pravossoudovitch},\n author_short = {Bonhomme, Y. and Girard, P. and Guiller, L. and Landrault, C. and Pravossoudovitch, S.},\n bibtype = {article},\n type = {article},\n year = {2004},\n key = {dblp3610843},\n id = {dblp3610843},\n biburl = {http://www.dblp.org/rec/bibtex/journals/et/BonhommeGGLP04},\n url = {http://dx.doi.org/10.1007/s10677-004-4252-2},\n journal = {J. Electronic Testing (ET)},\n pages = {647-660},\n number = {6},\n volume = {20},\n text = {J. Electronic Testing (ET) 20(6):647-660 (2004)}\n}","bibbaseid":"bonhomme-girard-guiller-landrault-pravossoudovitch-powerdrivenroutingconstrainedscanchaindesign-2004","role":"author","urls":{"Paper":"http://dx.doi.org/10.1007/s10677-004-4252-2"},"downloads":0},"search_terms":["power","driven","routing","constrained","scan","chain","design","bonhomme","girard","guiller","landrault","pravossoudovitch"],"keywords":[],"authorIDs":[],"dataSources":["eFAyQ6iBHTAatda2k"]}