@inproceedings{ dblp3561380,
  title = {An efficient scan tree design for test time reduction},
  author = {Yannick Bonhomme and Tomokazu Yoneda and Hideo Fujiwara and Patrick Girard},
  author_short = {Bonhomme, Y. and Yoneda, T. and Fujiwara, H. and Girard, P.},
  bibtype = {inproceedings},
  type = {inproceedings},
  year = {2004},
  key = {dblp3561380},
  id = {dblp3561380},
  biburl = {http://www.dblp.org/rec/bibtex/conf/ets/BonhommeYFG04},
  url = {http://doi.ieeecomputersociety.org/10.1109/ETSYM.2004.1347657},
  conference = {European Test Symposium},
  pages = {174-179},
  text = {European Test Symposium 2004:174-179},
  booktitle = {Proceedings of European Test Symposium}
}

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