An efficient scan tree design for test time reduction. Bonhomme, Y., Yoneda, T., Fujiwara, H., & Girard, P. In Proceedings of European Test Symposium, pages 174-179, 2004. Paper bibtex @inproceedings{ dblp3561380,
title = {An efficient scan tree design for test time reduction},
author = {Yannick Bonhomme and Tomokazu Yoneda and Hideo Fujiwara and Patrick Girard},
author_short = {Bonhomme, Y. and Yoneda, T. and Fujiwara, H. and Girard, P.},
bibtype = {inproceedings},
type = {inproceedings},
year = {2004},
key = {dblp3561380},
id = {dblp3561380},
biburl = {http://www.dblp.org/rec/bibtex/conf/ets/BonhommeYFG04},
url = {http://doi.ieeecomputersociety.org/10.1109/ETSYM.2004.1347657},
conference = {European Test Symposium},
pages = {174-179},
text = {European Test Symposium 2004:174-179},
booktitle = {Proceedings of European Test Symposium}
}
Downloads: 0
{"_id":"HCJKXSH8wpuD4PtwQ","bibbaseid":"bonhomme-yoneda-fujiwara-girard-anefficientscantreedesignfortesttimereduction-2004","downloads":0,"creationDate":"2015-04-07T17:36:59.943Z","title":"An efficient scan tree design for test time reduction","author_short":["Bonhomme, Y.","Yoneda, T.","Fujiwara, H.","Girard, P."],"year":2004,"bibtype":"inproceedings","biburl":"http://www.dblp.org/rec/bibtex/conf/ets/BonhommeYFG04","bibdata":{"title":"An efficient scan tree design for test time reduction","author":["Yannick Bonhomme","Tomokazu Yoneda","Hideo Fujiwara","Patrick Girard"],"author_short":["Bonhomme, Y.","Yoneda, T.","Fujiwara, H.","Girard, P."],"bibtype":"inproceedings","type":"inproceedings","year":"2004","key":"dblp3561380","id":"dblp3561380","biburl":"http://www.dblp.org/rec/bibtex/conf/ets/BonhommeYFG04","url":"http://doi.ieeecomputersociety.org/10.1109/ETSYM.2004.1347657","conference":"European Test Symposium","pages":"174-179","text":"European Test Symposium 2004:174-179","booktitle":"Proceedings of European Test Symposium","bibtex":"@inproceedings{ dblp3561380,\n title = {An efficient scan tree design for test time reduction},\n author = {Yannick Bonhomme and Tomokazu Yoneda and Hideo Fujiwara and Patrick Girard},\n author_short = {Bonhomme, Y. and Yoneda, T. and Fujiwara, H. and Girard, P.},\n bibtype = {inproceedings},\n type = {inproceedings},\n year = {2004},\n key = {dblp3561380},\n id = {dblp3561380},\n biburl = {http://www.dblp.org/rec/bibtex/conf/ets/BonhommeYFG04},\n url = {http://doi.ieeecomputersociety.org/10.1109/ETSYM.2004.1347657},\n conference = {European Test Symposium},\n pages = {174-179},\n text = {European Test Symposium 2004:174-179},\n booktitle = {Proceedings of European Test Symposium}\n}","bibbaseid":"bonhomme-yoneda-fujiwara-girard-anefficientscantreedesignfortesttimereduction-2004","role":"author","urls":{"Paper":"http://doi.ieeecomputersociety.org/10.1109/ETSYM.2004.1347657"},"downloads":0},"search_terms":["efficient","scan","tree","design","test","time","reduction","bonhomme","yoneda","fujiwara","girard"],"keywords":[],"authorIDs":[],"dataSources":["HubGkZcM2nM6WDm5a"]}