Determination of the Radii of Coated and Uncoated Silicon AFM Sharp Tips using Height Calibration Standard Grating and Nonlinear Regression Function. Boonpuek, P. & Felts, J. R. Beilstein Archives, 2023(1):34, Beilstein-Institut, 2023.
bibtex   
@article{boonpuek2023determination,
  title={Determination of the Radii of Coated and Uncoated Silicon AFM Sharp Tips using Height Calibration Standard Grating and Nonlinear Regression Function},
  author={Boonpuek, Perawat and Felts, Jonathan Robert},
  journal={Beilstein Archives},
  volume={2023},
  number={1},
  pages={34},
  year={2023},
  publisher={Beilstein-Institut}
}

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