Determination of the Radii of Coated and Uncoated Silicon AFM Sharp Tips using Height Calibration Standard Grating and Nonlinear Regression Function. Boonpuek, P. & Felts, J. R. Beilstein Archives, 2023(1):34, Beilstein-Institut, 2023. bibtex @article{boonpuek2023determination,
title={Determination of the Radii of Coated and Uncoated Silicon AFM Sharp Tips using Height Calibration Standard Grating and Nonlinear Regression Function},
author={Boonpuek, Perawat and Felts, Jonathan Robert},
journal={Beilstein Archives},
volume={2023},
number={1},
pages={34},
year={2023},
publisher={Beilstein-Institut}
}
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