Advanced test methods for SRAMs. Bosio, A., Dilillo, L., Girard, P., Pravossoudovitch, S., & Virazel, A. In Proceedings of VLSI Test Symposium (VTS), pages 300-301, 2012.
Advanced test methods for SRAMs [link]Paper  bibtex   
@inproceedings{ dblp2258484,
  title = {Advanced test methods for SRAMs},
  author = {Alberto Bosio and Luigi Dilillo and Patrick Girard and Serge Pravossoudovitch and Arnaud Virazel},
  author_short = {Bosio, A. and Dilillo, L. and Girard, P. and Pravossoudovitch, S. and Virazel, A.},
  bibtype = {inproceedings},
  type = {inproceedings},
  year = {2012},
  key = {dblp2258484},
  id = {dblp2258484},
  biburl = {http://www.dblp.org/rec/bibtex/conf/vts/BosioDGPV12},
  url = {http://dx.doi.org/10.1109/VTS.2012.6231070},
  conference = {VTS},
  pages = {300-301},
  text = {VTS 2012:300-301},
  booktitle = {Proceedings of VLSI Test Symposium (VTS)}
}

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