Why and How Controlling Power Consumption during Test: A Survey. Bosio, A., Dilillo, L., Girard, P., Todri, A., & Virazel, A. In Proceedings of Asian Test Symposium, pages 221-226, 2012.
Why and How Controlling Power Consumption during Test: A Survey [link]Paper  bibtex   
@inproceedings{ dblp2056268,
  title = {Why and How Controlling Power Consumption during Test: A Survey},
  author = {Alberto Bosio and Luigi Dilillo and Patrick Girard and Aida Todri and Arnaud Virazel},
  author_short = {Bosio, A. and Dilillo, L. and Girard, P. and Todri, A. and Virazel, A.},
  bibtype = {inproceedings},
  type = {inproceedings},
  year = {2012},
  key = {dblp2056268},
  id = {dblp2056268},
  biburl = {http://www.dblp.org/rec/bibtex/conf/ats/BosioDGTV12},
  url = {http://doi.ieeecomputersociety.org/10.1109/ATS.2012.30},
  conference = {Asian Test Symposium},
  pages = {221-226},
  text = {Asian Test Symposium 2012:221-226},
  booktitle = {Proceedings of Asian Test Symposium}
}

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