Why and How Controlling Power Consumption during Test: A Survey. Bosio, A., Dilillo, L., Girard, P., Todri, A., & Virazel, A. In Proceedings of Asian Test Symposium, pages 221-226, 2012.
Paper bibtex @inproceedings{ dblp2056268,
title = {Why and How Controlling Power Consumption during Test: A Survey},
author = {Alberto Bosio and Luigi Dilillo and Patrick Girard and Aida Todri and Arnaud Virazel},
author_short = {Bosio, A. and Dilillo, L. and Girard, P. and Todri, A. and Virazel, A.},
bibtype = {inproceedings},
type = {inproceedings},
year = {2012},
key = {dblp2056268},
id = {dblp2056268},
biburl = {http://www.dblp.org/rec/bibtex/conf/ats/BosioDGTV12},
url = {http://doi.ieeecomputersociety.org/10.1109/ATS.2012.30},
conference = {Asian Test Symposium},
pages = {221-226},
text = {Asian Test Symposium 2012:221-226},
booktitle = {Proceedings of Asian Test Symposium}
}
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