Automatic fault characterization via abnormality-enhanced classification. Bronevetsky, G., Laguna, I., de Supinski, B., & Bagchi, S. In Proc. 42nd International Conference on Dependable Systems and Networks, pages 1--12, Boston, Massachusetts , June 25 - 28, 2012. IEEE.
bibtex   
@Inproceedings{Bronevetsky_2012_13417,
  author = {Bronevetsky, G. and Laguna, I. and de Supinski, B.R. and Bagchi, S.},
 address = {Boston, Massachusetts },
booktitle = {Proc. 42nd International Conference on Dependable Systems and Networks},
 month = {June 25 - 28},
 organization = {IEEE},
 pages = {1--12},
 title = {Automatic fault characterization via abnormality-enhanced classification},
 year = {2012},
 title_with_no_special_chars = {Automatic fault characterization via abnormalityenhanced classification}
}

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