Automatic fault characterization via abnormality-enhanced classification. Bronevetsky, G., Laguna, I., de Supinski, B., & Bagchi, S. In Proc. 42nd International Conference on Dependable Systems and Networks, pages 1--12, Boston, Massachusetts , June 25 - 28, 2012. IEEE. bibtex @Inproceedings{Bronevetsky_2012_13417,
author = {Bronevetsky, G. and Laguna, I. and de Supinski, B.R. and Bagchi, S.},
address = {Boston, Massachusetts },
booktitle = {Proc. 42nd International Conference on Dependable Systems and Networks},
month = {June 25 - 28},
organization = {IEEE},
pages = {1--12},
title = {Automatic fault characterization via abnormality-enhanced classification},
year = {2012},
title_with_no_special_chars = {Automatic fault characterization via abnormalityenhanced classification}
}
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{"_id":"ZgAqEsH8eNfkTNvSa","bibbaseid":"bronevetsky-laguna-desupinski-bagchi-automaticfaultcharacterizationviaabnormalityenhancedclassification-2012","downloads":0,"creationDate":"2018-01-22T16:01:09.638Z","title":"Automatic fault characterization via abnormality-enhanced classification","author_short":["Bronevetsky, G.","Laguna, I.","de Supinski, B.","Bagchi, S."],"year":2012,"bibtype":"inproceedings","biburl":"http://www.uh.edu/bti/_files/bibsync_export2018-01-19.bib","bibdata":{"bibtype":"inproceedings","type":"inproceedings","author":[{"propositions":[],"lastnames":["Bronevetsky"],"firstnames":["G."],"suffixes":[]},{"propositions":[],"lastnames":["Laguna"],"firstnames":["I."],"suffixes":[]},{"propositions":["de"],"lastnames":["Supinski"],"firstnames":["B.R."],"suffixes":[]},{"propositions":[],"lastnames":["Bagchi"],"firstnames":["S."],"suffixes":[]}],"address":"Boston, Massachusetts ","booktitle":"Proc. 42nd International Conference on Dependable Systems and Networks","month":"June 25 - 28","organization":"IEEE","pages":"1--12","title":"Automatic fault characterization via abnormality-enhanced classification","year":"2012","title_with_no_special_chars":"Automatic fault characterization via abnormalityenhanced classification","bibtex":"@Inproceedings{Bronevetsky_2012_13417,\r\n author = {Bronevetsky, G. and Laguna, I. and de Supinski, B.R. and Bagchi, S.},\r\n address = {Boston, Massachusetts },\r\nbooktitle = {Proc. 42nd International Conference on Dependable Systems and Networks},\r\n month = {June 25 - 28},\r\n organization = {IEEE},\r\n pages = {1--12},\r\n title = {Automatic fault characterization via abnormality-enhanced classification},\r\n year = {2012},\r\n title_with_no_special_chars = {Automatic fault characterization via abnormalityenhanced classification}\r\n}\r\n\r\n","author_short":["Bronevetsky, G.","Laguna, I.","de Supinski, B.","Bagchi, S."],"key":"Bronevetsky_2012_13417","id":"Bronevetsky_2012_13417","bibbaseid":"bronevetsky-laguna-desupinski-bagchi-automaticfaultcharacterizationviaabnormalityenhancedclassification-2012","role":"author","urls":{},"downloads":0},"search_terms":["automatic","fault","characterization","via","abnormality","enhanced","classification","bronevetsky","laguna","de supinski","bagchi"],"keywords":[],"authorIDs":[],"dataSources":["9cexBw6hrwgyZphZZ"]}