{"_id":"M4kpzrGxtP3jEL2EW","bibbaseid":"brrnert-voigtlnder-rellinghaus-bchner-rmmeli-lichte-acheapandquicklyadaptableinsituelectricalcontactingtemsampleholderdesign","author_short":["Börrnert, F.","Voigtländer, R.","Rellinghaus, B.","Büchner, B.","Rümmeli, M. H.","Lichte, H."],"bibdata":{"bibtype":"article","type":"article","title":"A cheap and quickly adaptable in situ electrical contacting TEM sample holder design","issn":"0304-3991","url":"http://www.sciencedirect.com/science/article/pii/S0304399114000114","doi":"10.1016/j.ultramic.2014.01.001","abstract":"In situ electrical characterization of nanostructures inside a transmission electron microscope provides crucial insight into the mechanisms of functioning micro- and nano-electronic devices. For such in situ investigations specialized sample holders are necessary. A simple and affordable but flexible design is important, especially, when sample geometries change, a holder should be adaptable with minimum effort. Atomic resolution imaging is standard nowadays, so a sample holder must ensure this capability. A sample holder design for on-chip samples is presented that fulfils these requisites. On-chip sample devices have the advantage that they can be manufactured via standard fabrication routes.","urldate":"2014-01-29","journal":"Ultramicroscopy","author":[{"propositions":[],"lastnames":["Börrnert"],"firstnames":["Felix"],"suffixes":[]},{"propositions":[],"lastnames":["Voigtländer"],"firstnames":["Ralf"],"suffixes":[]},{"propositions":[],"lastnames":["Rellinghaus"],"firstnames":["Bernd"],"suffixes":[]},{"propositions":[],"lastnames":["Büchner"],"firstnames":["Bernd"],"suffixes":[]},{"propositions":[],"lastnames":["Rümmeli"],"firstnames":["Mark","H."],"suffixes":[]},{"propositions":[],"lastnames":["Lichte"],"firstnames":["Hannes"],"suffixes":[]}],"keywords":"Electrical contacting, In situ TEM, TEM sample holder","bibtex":"@article{borrnert_cheap_nodate,\n\ttitle = {A cheap and quickly adaptable in situ electrical contacting {TEM} sample holder design},\n\tissn = {0304-3991},\n\turl = {http://www.sciencedirect.com/science/article/pii/S0304399114000114},\n\tdoi = {10.1016/j.ultramic.2014.01.001},\n\tabstract = {In situ electrical characterization of nanostructures inside a transmission electron microscope provides crucial insight into the mechanisms of functioning micro- and nano-electronic devices. For such in situ investigations specialized sample holders are necessary. A simple and affordable but flexible design is important, especially, when sample geometries change, a holder should be adaptable with minimum effort. Atomic resolution imaging is standard nowadays, so a sample holder must ensure this capability. A sample holder design for on-chip samples is presented that fulfils these requisites. On-chip sample devices have the advantage that they can be manufactured via standard fabrication routes.},\n\turldate = {2014-01-29},\n\tjournal = {Ultramicroscopy},\n\tauthor = {Börrnert, Felix and Voigtländer, Ralf and Rellinghaus, Bernd and Büchner, Bernd and Rümmeli, Mark H. and Lichte, Hannes},\n\tkeywords = {Electrical contacting, In situ TEM, TEM sample holder},\n}\n\n","author_short":["Börrnert, F.","Voigtländer, R.","Rellinghaus, B.","Büchner, B.","Rümmeli, M. H.","Lichte, H."],"key":"borrnert_cheap_nodate","id":"borrnert_cheap_nodate","bibbaseid":"brrnert-voigtlnder-rellinghaus-bchner-rmmeli-lichte-acheapandquicklyadaptableinsituelectricalcontactingtemsampleholderdesign","role":"author","urls":{"Paper":"http://www.sciencedirect.com/science/article/pii/S0304399114000114"},"keyword":["Electrical contacting","In situ TEM","TEM sample holder"],"metadata":{"authorlinks":{}},"html":""},"bibtype":"article","biburl":"https://bibbase.org/zotero/spintextures","dataSources":["rXHvWQJHcL8ctHS4s"],"keywords":["electrical contacting","in situ tem","tem sample holder"],"search_terms":["cheap","quickly","adaptable","situ","electrical","contacting","tem","sample","holder","design","börrnert","voigtländer","rellinghaus","büchner","rümmeli","lichte"],"title":"A cheap and quickly adaptable in situ electrical contacting TEM sample holder design","year":null}