A cheap and quickly adaptable in situ electrical contacting TEM sample holder design. Börrnert, F., Voigtländer, R., Rellinghaus, B., Büchner, B., Rümmeli, M. H., & Lichte, H. Ultramicroscopy.
A cheap and quickly adaptable in situ electrical contacting TEM sample holder design [link]Paper  doi  abstract   bibtex   
In situ electrical characterization of nanostructures inside a transmission electron microscope provides crucial insight into the mechanisms of functioning micro- and nano-electronic devices. For such in situ investigations specialized sample holders are necessary. A simple and affordable but flexible design is important, especially, when sample geometries change, a holder should be adaptable with minimum effort. Atomic resolution imaging is standard nowadays, so a sample holder must ensure this capability. A sample holder design for on-chip samples is presented that fulfils these requisites. On-chip sample devices have the advantage that they can be manufactured via standard fabrication routes.
@article{borrnert_cheap_nodate,
	title = {A cheap and quickly adaptable in situ electrical contacting {TEM} sample holder design},
	issn = {0304-3991},
	url = {http://www.sciencedirect.com/science/article/pii/S0304399114000114},
	doi = {10.1016/j.ultramic.2014.01.001},
	abstract = {In situ electrical characterization of nanostructures inside a transmission electron microscope provides crucial insight into the mechanisms of functioning micro- and nano-electronic devices. For such in situ investigations specialized sample holders are necessary. A simple and affordable but flexible design is important, especially, when sample geometries change, a holder should be adaptable with minimum effort. Atomic resolution imaging is standard nowadays, so a sample holder must ensure this capability. A sample holder design for on-chip samples is presented that fulfils these requisites. On-chip sample devices have the advantage that they can be manufactured via standard fabrication routes.},
	urldate = {2014-01-29},
	journal = {Ultramicroscopy},
	author = {Börrnert, Felix and Voigtländer, Ralf and Rellinghaus, Bernd and Büchner, Bernd and Rümmeli, Mark H. and Lichte, Hannes},
	keywords = {Electrical contacting, In situ TEM, TEM sample holder},
}

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