Thickness dependence of the magnetic properties of ripple-patterned Fe/MgO(001) films. Büttner, F., Zhang, K., Seyffarth, S., Liese, T., Krebs, H., Vaz, C. A. F., & Hofsäss, H. Physical Review B, 84:064427, American Physical Society (APS), 2011. Paper doi bibtex @article{10.1103/physrevb.84.064427,
doi = {10.1103/physrevb.84.064427},
url = {http://dx.doi.org/10.1103/physrevb.84.064427},
year = 2011,
publisher = {American Physical Society ({APS})},
volume = {84},
author = {Felix Büttner and Kun Zhang and Susanne Seyffarth and Tobias Liese and Hans-Ulrich Krebs and C. A. F. Vaz and Hans Hofsäss},
title = {Thickness dependence of the magnetic properties of ripple-patterned Fe/{MgO}(001) films},
journal = {Physical Review B},
pages = {064427}
}
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