@article{bunina_structural_2012,
	title = {Structural {Properties} of {Composite} {Thin} {Films} {BiFeO3} - {Ba0}.{8Sr0}.{2TiO3}},
	volume = {439},
	issn = {0015-0193},
	url = {https://doi.org/10.1080/00150193.2012.741920},
	doi = {10.1080/00150193.2012.741920},
	abstract = {The results of X-ray diffraction study of a new promising magnetoelectric composite films with alternating layers of barium strontium titanate and bismuth ferrite with layer thicknesses d = 6–200 nm are presented. All films show epitaxial growth on the MgO single crystals substrates. The 00L profiles for thick layered films (d {\textgreater} 15 nm) consist of the two reflections corresponding to the separate coherent scattering regions of composite layers. The XRD patterns of thin layered films testify the formation of superlattice. The mean microstrain and mean size of coherent scattering regions were determined using the Willamson-Hall approach.},
	number = {1},
	urldate = {2023-11-11},
	journal = {Ferroelectrics},
	author = {Bunina, O. A. and Zakharchenko, I. N. and Golovko, Yu. I. and Mukhortov, V. M. and Stryukov, D. V. and Yuzyuk, Yu. I.},
	month = jan,
	year = {2012},
	note = {Publisher: Taylor \& Francis
\_eprint: https://doi.org/10.1080/00150193.2012.741920},
	keywords = {Thin films, X-ray diffraction, magnetoelectric composite, superlattice},
	pages = {67--73},
}

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