Identification of Critical Paths in Circuits with Level-Sensitive Latches. Burks, T. M., Sakallah, K. A., & Mudge, T. N. In Digest of IEEE International Conference on Computer-Aided Design (ICCAD), pages 137-141, Santa Clara, California, November, 1992.
bibtex   
@inproceedings{burks1992identification,
   author = {Burks, Timothy M. and Sakallah, Karem A. and Mudge, Trevor N.},
   title = {{Identification of Critical Paths in Circuits with Level-Sensitive Latches}},
   booktitle = {Digest of IEEE International Conference on Computer-Aided Design (ICCAD)},
   address = {Santa Clara, California},
   pages = {137-141},
   month = {November},
   year = {1992}
}
Downloads: 0