Identification of Critical Paths in Circuits with Level-Sensitive Latches. Burks, T. M., Sakallah, K. A., & Mudge, T. N. In Digest of IEEE International Conference on Computer-Aided Design (ICCAD), pages 137-141, Santa Clara, California, November, 1992. bibtex @inproceedings{burks1992identification,
author = {Burks, Timothy M. and Sakallah, Karem A. and Mudge, Trevor N.},
title = {{Identification of Critical Paths in Circuits with Level-Sensitive Latches}},
booktitle = {Digest of IEEE International Conference on Computer-Aided Design (ICCAD)},
address = {Santa Clara, California},
pages = {137-141},
month = {November},
year = {1992}
}