View variation of point-set and line-segment features. Burns, J B, Weiss, R S, & Riseman, E M IEEE Transactions on Pattern Analysis and Machine Intelligence, 15(1):51–68, 1993.
bibtex   
@article{burns_view_1993,
	title = {View variation of point-set and line-segment features},
	volume = {15},
	number = {1},
	journal = {IEEE Transactions on Pattern Analysis and Machine Intelligence},
	author = {Burns, J B and Weiss, R S and Riseman, E M},
	year = {1993},
	keywords = {object recognition, computer vision, viewpoint-dep},
	pages = {51--68},
}

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