LVS check for photonic integrated circuits: curvilinear feature extraction and validation. Cao, R., Billoudet, J., Ferguson, J., Couder, L., Cayo, J., Arriordaz, A., & O'Connor, I. In Nebel, W. & Atienza, D., editors, DATE, pages 1253-1256, 2015. ACM.
LVS check for photonic integrated circuits: curvilinear feature extraction and validation. [link]Link  LVS check for photonic integrated circuits: curvilinear feature extraction and validation. [link]Paper  bibtex   
@inproceedings{conf/date/CaoBFCCAO15,
  added-at = {2017-04-30T00:00:00.000+0200},
  author = {Cao, Ruping and Billoudet, Julien and Ferguson, John and Couder, Lionel and Cayo, John and Arriordaz, Alexandre and O'Connor, Ian},
  biburl = {https://www.bibsonomy.org/bibtex/2766fae4c6dd71eaa63764c3d57e2218c/dblp},
  booktitle = {DATE},
  crossref = {conf/date/2015},
  editor = {Nebel, Wolfgang and Atienza, David},
  ee = {http://ieeexplore.ieee.org/document/7092582/},
  interhash = {092367c427aa53d51dbe327433ad4f41},
  intrahash = {766fae4c6dd71eaa63764c3d57e2218c},
  isbn = {978-3-9815370-4-8},
  keywords = {dblp},
  pages = {1253-1256},
  publisher = {ACM},
  timestamp = {2019-10-17T15:04:40.000+0200},
  title = {LVS check for photonic integrated circuits: curvilinear feature extraction and validation.},
  url = {http://dblp.uni-trier.de/db/conf/date/date2015.html#CaoBFCCAO15},
  year = 2015
}

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