Measuring Multiresolution Surface Roughness Using V-System. Cao, W., Cai, Z., & Ye, B. IEEE Trans. Geoscience and Remote Sensing, 56(3):1497–1506, 2018. Paper doi bibtex @article{DBLP:journals/tgrs/CaoCY18,
author = {Wei Cao and
Zhanchuan Cai and
Ben Ye},
title = {Measuring Multiresolution Surface Roughness Using V-System},
journal = {{IEEE} Trans. Geoscience and Remote Sensing},
volume = {56},
number = {3},
pages = {1497--1506},
year = {2018},
url = {https://doi.org/10.1109/TGRS.2017.2764519},
doi = {10.1109/TGRS.2017.2764519},
timestamp = {Wed, 11 Apr 2018 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tgrs/CaoCY18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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