Measuring Multiresolution Surface Roughness Using V-System. Cao, W., Cai, Z., & Ye, B. IEEE Trans. Geoscience and Remote Sensing, 56(3):1497–1506, 2018.
Measuring Multiresolution Surface Roughness Using V-System [link]Paper  doi  bibtex   
@article{DBLP:journals/tgrs/CaoCY18,
  author    = {Wei Cao and
               Zhanchuan Cai and
               Ben Ye},
  title     = {Measuring Multiresolution Surface Roughness Using V-System},
  journal   = {{IEEE} Trans. Geoscience and Remote Sensing},
  volume    = {56},
  number    = {3},
  pages     = {1497--1506},
  year      = {2018},
  url       = {https://doi.org/10.1109/TGRS.2017.2764519},
  doi       = {10.1109/TGRS.2017.2764519},
  timestamp = {Wed, 11 Apr 2018 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/journals/tgrs/CaoCY18.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}

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