The parameterless correction method in X-ray microanalysis. Cappellen, E. V. Microscopy Microanalysis Microstructures, 1(1):1–22, February, 1990. 00135
The parameterless correction method in X-ray microanalysis [link]Paper  doi  abstract   bibtex   
Microscopy Microanalysis Microstructures, a publication of the Société Française des Microscopies
@article{cappellen_parameterless_1990,
	title = {The parameterless correction method in {X}-ray microanalysis},
	volume = {1},
	copyright = {EDP Sciences},
	issn = {1154-2799},
	url = {http://dx.doi.org/10.1051/mmm:01990001010100},
	doi = {10/c3skzq},
	abstract = {Microscopy Microanalysis Microstructures, a publication of the Société Française des Microscopies},
	language = {en},
	number = {1},
	urldate = {2019-10-08},
	journal = {Microscopy Microanalysis Microstructures},
	author = {Cappellen, Eric Van},
	month = feb,
	year = {1990},
	note = {00135},
	pages = {1--22},
}

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