A robust data-driven fault diagnosis scheme based on recursive dempster-shafer combination rule. Cartocci, N., Napolitano, M. R., Costante, G., Crocetti, F., Valigi, P., & Fravolini, M. L. In 2021 29th Mediterranean Conference on Control and Automation, MED 2021, pages 1070–1075, 2021. Institute of Electrical and Electronics Engineers Inc..
doi  bibtex   
@inproceedings{
	11391_1501150,
	author = {Cartocci, N. and Napolitano, M. R. and Costante, G. and Crocetti, F. and Valigi, P. and Fravolini, M. L.},
	title = {A robust data-driven fault diagnosis scheme based on recursive dempster-shafer combination rule},
	year = {2021},
	publisher = {Institute of Electrical and Electronics Engineers Inc.},
	booktitle = {2021 29th Mediterranean Conference on Control and Automation, MED 2021},
	doi = {10.1109/MED51440.2021.9480256},
	isbn = {978-1-6654-2258-1},	
	pages = {1070--1075}
}

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