Failure Analysis-assisted FMEA. Cassanelli, G., Mura, G., Fantini, F., Vanzi, M., & Plano, B. Microelectronics Reliability, 46(9-11):1795-1799, 2006. Link Paper bibtex @article{ journals/mr/CassanelliMFVP06,
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author = {Cassanelli, G. and Mura, Giovanna and Fantini, Fausto and Vanzi, Massimo and Plano, Bernard},
biburl = {http://www.bibsonomy.org/bibtex/21c8638730da7826615bcab112bcede74/dblp},
ee = {http://dx.doi.org/10.1016/j.microrel.2006.07.072},
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journal = {Microelectronics Reliability},
keywords = {dblp},
number = {9-11},
pages = {1795-1799},
title = {Failure Analysis-assisted FMEA.},
url = {http://dblp.uni-trier.de/db/journals/mr/mr46.html#CassanelliMFVP06},
volume = {46},
year = {2006}
}
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