Failure Analysis-assisted FMEA. Cassanelli, G., Mura, G., Fantini, F., Vanzi, M., & Plano, B. Microelectronics Reliability, 46(9-11):1795-1799, 2006.
Failure Analysis-assisted FMEA. [link]Link  Failure Analysis-assisted FMEA. [link]Paper  bibtex   
@article{ journals/mr/CassanelliMFVP06,
  added-at = {2015-03-27T00:00:00.000+0100},
  author = {Cassanelli, G. and Mura, Giovanna and Fantini, Fausto and Vanzi, Massimo and Plano, Bernard},
  biburl = {http://www.bibsonomy.org/bibtex/21c8638730da7826615bcab112bcede74/dblp},
  ee = {http://dx.doi.org/10.1016/j.microrel.2006.07.072},
  interhash = {06a08d3f892086bec3ae1213c7c29e11},
  intrahash = {1c8638730da7826615bcab112bcede74},
  journal = {Microelectronics Reliability},
  keywords = {dblp},
  number = {9-11},
  pages = {1795-1799},
  title = {Failure Analysis-assisted FMEA.},
  url = {http://dblp.uni-trier.de/db/journals/mr/mr46.html#CassanelliMFVP06},
  volume = {46},
  year = {2006}
}
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