Measuring Masking Fault-Tolerance. Castro, P. F., D'Argenio, P. R., Demasi, R., & Putruele, L. CoRR, 2018. Paper bibtex @article{DBLP:journals/corr/abs-1811-05548,
author = {Pablo F. Castro and
Pedro R. D'Argenio and
Ramiro Demasi and
Luciano Putruele},
title = {Measuring Masking Fault-Tolerance},
journal = {CoRR},
volume = {abs/1811.05548},
year = {2018},
url = {http://arxiv.org/abs/1811.05548},
archivePrefix = {arXiv},
eprint = {1811.05548},
timestamp = {Sat, 24 Nov 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/corr/abs-1811-05548.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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{"_id":"tpmSH3o8fGrK29PRP","bibbaseid":"castro-dargenio-demasi-putruele-measuringmaskingfaulttolerance-2018","authorIDs":[],"author_short":["Castro, P. F.","D'Argenio, P. R.","Demasi, R.","Putruele, L."],"bibdata":{"bibtype":"article","type":"article","author":[{"firstnames":["Pablo","F."],"propositions":[],"lastnames":["Castro"],"suffixes":[]},{"firstnames":["Pedro","R."],"propositions":[],"lastnames":["D'Argenio"],"suffixes":[]},{"firstnames":["Ramiro"],"propositions":[],"lastnames":["Demasi"],"suffixes":[]},{"firstnames":["Luciano"],"propositions":[],"lastnames":["Putruele"],"suffixes":[]}],"title":"Measuring Masking Fault-Tolerance","journal":"CoRR","volume":"abs/1811.05548","year":"2018","url":"http://arxiv.org/abs/1811.05548","archiveprefix":"arXiv","eprint":"1811.05548","timestamp":"Sat, 24 Nov 2018 00:00:00 +0100","biburl":"https://dblp.org/rec/journals/corr/abs-1811-05548.bib","bibsource":"dblp computer science bibliography, https://dblp.org","bibtex":"@article{DBLP:journals/corr/abs-1811-05548,\n author = {Pablo F. Castro and\n Pedro R. D'Argenio and\n Ramiro Demasi and\n Luciano Putruele},\n title = {Measuring Masking Fault-Tolerance},\n journal = {CoRR},\n volume = {abs/1811.05548},\n year = {2018},\n url = {http://arxiv.org/abs/1811.05548},\n archivePrefix = {arXiv},\n eprint = {1811.05548},\n timestamp = {Sat, 24 Nov 2018 00:00:00 +0100},\n biburl = {https://dblp.org/rec/journals/corr/abs-1811-05548.bib},\n bibsource = {dblp computer science bibliography, https://dblp.org}\n}\n\n","author_short":["Castro, P. F.","D'Argenio, P. R.","Demasi, R.","Putruele, L."],"key":"DBLP:journals/corr/abs-1811-05548","id":"DBLP:journals/corr/abs-1811-05548","bibbaseid":"castro-dargenio-demasi-putruele-measuringmaskingfaulttolerance-2018","role":"author","urls":{"Paper":"http://arxiv.org/abs/1811.05548"},"downloads":0,"html":""},"bibtype":"article","biburl":"https://dblp.org/pid/57/1847.bib","creationDate":"2020-03-30T21:52:56.573Z","downloads":0,"keywords":[],"search_terms":["measuring","masking","fault","tolerance","castro","d'argenio","demasi","putruele"],"title":"Measuring Masking Fault-Tolerance","year":2018,"dataSources":["odknEzArZpzeByAHu"]}