@inproceedings{ conf/itc/CatyBMLBC03,
  added-at = {2015-08-26T00:00:00.000+0200},
  author = {Caty, Olivier and Bayraktaroglu, Ismet and Majumdar, Amitava and Lee, Richard and Bell, John and Curhan, Lisa},
  biburl = {http://www.bibsonomy.org/bibtex/21462c306048ea716b2a54603abbc1e87/dblp},
  booktitle = {ITC},
  crossref = {conf/itc/2003},
  ee = {http://doi.ieeecomputersociety.org/10.1109/TEST.2003.1271083},
  interhash = {63be9a622683e27755df137e462c4a51},
  intrahash = {1462c306048ea716b2a54603abbc1e87},
  isbn = {0-7803-8106-8},
  keywords = {dblp},
  pages = {961-970},
  publisher = {IEEE Computer Society},
  title = {Instruction Based BIST for Board/System Level Test of External Memories and Internconnects.},
  url = {http://dblp.uni-trier.de/db/conf/itc/itc2003.html#CatyBMLBC03},
  year = {2003}
}

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