Stochastic threshold group testing. Chan, C. L., Cai, S., Bakshi, M., Jaggi, S., & Saligrama, V. In 2013 IEEE Information Theory Workshop, ITW 2013, Sevilla, Spain, September 9-13, 2013, pages 1–5, 2013. IEEE.
Stochastic threshold group testing [link]Paper  doi  bibtex   
@inproceedings{DBLP:conf/itw/ChanCBJS13,
  author       = {Chun Lam Chan and
                  Sheng Cai and
                  Mayank Bakshi and
                  Sidharth Jaggi and
                  Venkatesh Saligrama},
  title        = {Stochastic threshold group testing},
  booktitle    = {2013 {IEEE} Information Theory Workshop, {ITW} 2013, Sevilla, Spain,
                  September 9-13, 2013},
  pages        = {1--5},
  publisher    = {{IEEE}},
  year         = {2013},
  url          = {https://doi.org/10.1109/ITW.2013.6691242},
  doi          = {10.1109/ITW.2013.6691242},
  timestamp    = {Sat, 05 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/itw/ChanCBJS13.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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