Stochastic threshold group testing. Chan, C. L., Cai, S., Bakshi, M., Jaggi, S., & Saligrama, V. In 2013 IEEE Information Theory Workshop, ITW 2013, Sevilla, Spain, September 9-13, 2013, pages 1–5, 2013. IEEE. Paper doi bibtex @inproceedings{DBLP:conf/itw/ChanCBJS13,
author = {Chun Lam Chan and
Sheng Cai and
Mayank Bakshi and
Sidharth Jaggi and
Venkatesh Saligrama},
title = {Stochastic threshold group testing},
booktitle = {2013 {IEEE} Information Theory Workshop, {ITW} 2013, Sevilla, Spain,
September 9-13, 2013},
pages = {1--5},
publisher = {{IEEE}},
year = {2013},
url = {https://doi.org/10.1109/ITW.2013.6691242},
doi = {10.1109/ITW.2013.6691242},
timestamp = {Sat, 05 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itw/ChanCBJS13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
Downloads: 0
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